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New MALDI Imaging Applications Note

Published: August 25 2017

JEOL USA has produced a new MALDI imaging technical applications note that describes the unique analytical process for a variety of biological and organic samples. MALDI imaging is a powerful mass spectrometry technique available with JEOL’s

New JEOL JSM-IT300HR InTouchScope™ SEM

Published: May 12 2017

Ultrahigh resolution imaging of large samples in their native state   JEOL USA introduces a new Scanning Electron Microscope (SEM) that combines the performance of a Field Emission SEM with the simplicity of the JEOL InTouchScope SEM

JEOL Exhibits InTouchScope SEM and Cross Section Polishing Abilities at Ceramics Expo

Published: May 4 2017

JEOL, a global leader in scanning electron microscopy (SEM) for imaging and analysis, will exhibit its popular InTouchScope series SEM at Ceramics Expo in Cleveland, OH on April 25-27.   From surface observation to cross-section imaging and

JEOL Resonance Introduces New Zero Boil Off Magnet for NMR Systems

Published: April 23 2013

JEOL Resonance has developed a new Nuclear Magnetic Resonance (NMR) super conducting magnet that operates on a minimum amount of liquid helium. The new NMR system will be announced at the 54th Experimental Nuclear Magnetic Resonance Conference (ENC)

JEOL High Sensitivity GC-TOF Increases Data Acquisition Speed and Mass Resolving Power

Published: August 7 2012

JEOL’s newest AccuTOF GCv model - the “4G” - now offers even faster data acquisition rates and higher resolving power than its predecessor.  The AccuTOF-GCv|4G has a maximum data acquisition rate of 50 spectra per second and a

NEW JCM-6000 NeoScope II with higher magnification and multi-touch screen control, and a sleek new design

Published: July 26 2012

As simple to use as a digital camera, the NeoScope II is a high resolution SEM that produces images with a large depth of field at magnifications ranging from 10X - 60,000X. It offers high & low vacuum operation, three selectable accelerating

JEOL Introduces Ultra-high Resolution Analytical Field Emission SEM

Published: June 1 2012

Highest performance FE-SEM optimized for sub-nm resolution imaging of any type of sample JEOL's new series of field emission scanning electron microscopes is now complete with the introduction of the sub-nanometer imaging resolution

JEOL Introduces New Versatile FE-SEM Series for Sub-Nanometer Imaging and Analysis of Nanostructures and Magnetic Samples

Published: April 18 2012

JEOL launches a new series of Field Emission Scanning Electron Microscopes (FE-SEM) that offer expanded imaging and analysis capabilities customizable to performance requirements.  The JEOL JSM-7100F series offers sub-1 nm imaging capabilities

JEOL Unveils New High Throughput, Automated TEM for Nano-analysis

Published: July 18 2011

July 12, 2011 (Peabody, Mass.) -- A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 fea

JEOL Introduces New Environmental Control System for Scientific Instrument Labs

Published: July 11 2011

Scientific instrumentation is typically housed in an enclosed room, with just enough access for operation or service. The heat generated from equipment, personnel entering and exiting the room, and the enclosed facility itself can all affect the perf

JEOL “Flash & Go”TM Speeds Operation of ARM200F Cold FEG Transmission Electron Microscope

Published: May 24 2011

JEOL’s atomic resolution Transmission Electron Microscope (TEM), the JEM-ARM200F, sets a new standard for rapidly resuming operation after flashing, a routine procedure conducted with any TEM featuring a Cold FEG source. Long considered a tradeoff fo