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X-ray Fluorescence Articles

Image: Epsilon 1: the next generation

The next generation of Epsilon 1 X-ray fluorescence (XRF) spectrometers has been launched today by Malvern Panalytical. This compact yet powerful instrument is a mainstay across industry, enabling fast and reproducible elemental analysis – but...

Image: Introduction to X-ray fluorescence (XRF) and particle characterization in cement

The careful control of process parameters in the cement industry is the difference between profit and failure in an industry where specifications are fixed and the variables are the feed composition and energy costs. Raw materials (chiefly limestone...

Image: Analysis of inorganic major and minor compounds in un-ashed coal samples prepared as pressed powder

This data sheet shows that the Epsilon 4 – a high performance energy dispersive X-ray fluorescence spectrometer – is capable of analyzing Na2O, MgO, Al2O3, SiO2, P2O5, S, K2O, CaO, TiO2, MnO, Fe2O3, SrO and BaO in un-ashed coal samples...

Image: Elemental impurity analysis of pharmaceutical materials using X-ray fluorescence spectrometry

The recent changes to the United States Pharmacopeia (USP) regarding requirements for elemental impurity testing has peaked interest into new ways to perform this testing. Combining these new requirements with the introduction of USP chapter <...

Image: Fast and accurate at-line elemental analysis for the industry

Malvern Panalytical presents Epsilon 4, the new high-performance benchtop analytical tool for the determination of the chemical composition of all kinds of material. Built on the experience and success of the proven Epsilon 3 range of XRF...

Image: Characterizing Liposome Formation, Structure, and Stability with Complementary Techniques

Liposomes have been used in drug discovery and drug delivery for some time, and the biophysical characterization of these systems and their payloads is critical to understanding and optimizing their fabrication and function. This study looks at...

Image: Launch of the FT150 Series Fluorescent X-Ray Coating Thickness Gauge

Hitachi High-Tech Science Corporation (Hitachi High-Tech Science, President: Toshiyuki Ikeda) announced the release of the FT150 series (FT150/ FT150h/ FT150L) of X-ray coating thickness gauges for measuring plating thickness and composition at...

Image: Rigaku Launch The Smart Sample Loading System for Their Primus WDXRF Spectrometers

Rigaku Corporation is pleased to announce the introduction of the new Smart Sample Loading System for use on its ZSX Primus wavelength dispersive X-ray fluorescence (WDXRF) spectrometers. The Smart Sample Loading System has been developed in...

Image: PANalytical’s Epsilon 3X benchtop spectrometers outperform light-element analysis

PANalytical presented their upgraded Epsilon 3X benchtop X-ray fluorescence (XRF) spectrometers to the public at this year’s AXAA conference (9-13 February, Perth, Australia). Built upon the experience and success of the first generation...

Image: Shimadzu's New EDX Fluorescence Spectrometers Achieve Precise, High-Sensitivity Analysis of a Wide Range of Elements

Shimadzu Scientific Instruments announces the release of its new series of high-end energy dispersive X-ray fluorescence spectrometers. Incorporating a new high-performance semiconductor detector, the EDX-7000/8000 spectrometers offer excellent...

Image: New Portable Spectroscout Xrf Analyzer Enables Laboratory-Quality Analysis In Remote Locations

SPECTRO Analytical Instruments announces the introduction of its new SPECTROSCOUT Portable Energy Dispersive X-ray Fluorescence (ED-XRF) analyzer that enables rapid, laboratory-class elemental analysis of environmental and geological samples even in...

Image: SPECTRO LAUNCHES NEXT GENERATION SPECTRO xSORT

Handheld EDXRF Spectrometer Offers Breakthrough Speed, Accuracy, and Ease of Use.  SPECTRO Analytical Instruments, a leading supplier of analytical instruments for optical emission and XRF spectrometry, has introduced the next-generation SP...

Optimized excitation and detection guarantee outstanding sensitivity and accuracy for the analysis of heavy and other metals in a wide range of materials Kleve, Germany, May 2011 – The latest addition to the SPECTRO XEPOS Series is optimized for t...

COLUMBIA, Md., March 13, 2011 — The new EDX-LE from Shimadzu Scientific Instruments is an energy dispersive X-ray (EDX) fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. Its automated analysis fu...