Bruker Optics Merlin-G

Found In: Atomic Force Microscopes

Merlin is the global standard in 15nm production mask repair – RAVE nanomachining has become the preferred production technique for ultra-precision

Bruker Optics JVX7300HR

Found In: X-ray Diffraction

The Bruker JVX7300HR is a state of the art X-ray metrology platform for monitoring epi processing at 14nm and above. It incorporates the patented

Bruker Optics JV Sensus

Found In: X-ray Diffraction

X-Ray Diffraction Imaging (XRDI) inspection  The JVSensus is the latest defect metrology system for Si device manufacturers. It helps identify

Bruker Optics DektakXT

Found In: FT-IR Spectrophotometers

Step Up to Ultimate Performance in Stylus Profiling

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