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Found In: Atomic Force Microscopes
BioScope Catalyst Atomic Force Microscope Performance and Simplicity Perfected for BioAFM
Bruker AXS Dimension Automated AFP
Found In: Atomic Force Microscopes
Get the highest performance device characterization and etch depth metrology available with the Dimension Atomic Force Profiler. It is
Found In: Atomic Force Microscopes
The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of
Found In: Atomic Force Microscopes
The Dimension® Icon® Atomic Force Microscope with ScanAsyst™ brings new levels of performance, functionality, and AFM accessibility to
Found In: Atomic Force Microscopes
MultiMode 8 Atomic Force Microscope Discover How The Legendary MultiMode AFM Keeps Getting Better
Found In: Atomic Force Microscopes
Automated Atomic Force Microscope Cuts Etch Measurement Turnaround Time
Found In: Atomic Force Microscopes
Lowest noise, highest resolution Atomic Force Microscope in its class
Found In: Atomic Force Microscopes
Production-based 3D reference metrology for 45 nm and below
Bruker AXS Dimension FastScan Bio
Found In: Atomic Force Microscopes
Capturing Biological Dynamics with Ease
Found In: Atomic Force Microscopes
Patterned Sapphire Substrate Resolution For Now And The Future
