Advertisement

Search Results

Showing Items 1 - 10 of 51

JEOL JSM-IT300HR InTouchScope™ Scanning Electron Microscope

Found In: Electron Microscopes

The JSM-IT300HR is a new model of JEOL InTouchScope Series.  Equipped with a new high-brightness electron gun and optical system, the

JEOL JSM-IT300

Found In: Electron Microscopes

In addition to the high image quality observation due to the improvement of the illuminating system, the vacuum system and the signal processing

JEOL JSM-IT300LV

Found In: Electron Microscopes

The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs.

JEOL JSM 840

Found In: Electron Microscopes

SM-840 examines structure by bombarding the specimen with a scanning beam of electrons and then collecting slow moving secondary electrons that the

JEOL JXA-840

Found In: Electron Microscopes

JSM-840 examines structure by bombarding the specimen with a scanning beam of electrons and then collecting slow moving secondary electrons.

JEOL JSM-6510

Found In: Electron Microscopes

JSM-6510 Scanning Electron Microscope; World’s most widely-used family of SEMs!

JEOL JMS-S3000 SpiralTOF™

Found In: TOF-MS

MALDI-TOF Mass Spectrometer Incorporating a New Spiral TOF Ion Optic System Capable of High Resolution Mass Analysis over a Wide Molecular Weight Rang

JEOL AccuTOF™ DART®

Found In: TOF-MS

AccuTOF™ DART® Direct Analysis in Real Time Time-of-Flight Mass Spectrometer

JEOL AccuTOF™

Found In: LC-TOF MS

AccuTOF™ LC Liquid Chromatograph Time-of-Flight Mass Spectrometer

Ask a Question

Please enter all fields

JEOL

Add a Post to Browse Categories Questions and Answers


Advertisement

Advertisement

Advertisement

Advertisement

Advertisement