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FEI Company Helios G4 HX DualBeam™

Found In: Electron Microscopes

Designed to meet the challenges of advanced semiconductor failure analysis labs

FEI Company Helios™ PFIB DualBeam™

Found In: Electron Microscopes

Large Area Sample Preparation and Analysis in semiconductor failure analysis, process development, and process control laboratories

FEI Company Helios G4 PFIB UXe DualBeam

Found In: Electron Microscopes

Enabling breakthrough innovations with DualBeam™ technology—faster and easier than ever before.

FEI Company Helios G4 PFIB CXe DualBEam

Found In: Electron Microscopes

Enabling breakthrough innovations with DualBeam™ technology—faster and easier than ever before.

FEI Company Helios G4 UX DualBeam™

Found In: Electron Microscopes

Fastest and easiest preparation of the highest quality samples for HR S/TEM and APT

FEI Company Helios G4 CX DualBeam™

Found In: Electron Microscopes

Access the highest-resolution, multi-scale, and multi-modal subsurface and 3D information

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