JEOL JMS-S3000 SpiralTOF™


JMS-S3000 SpiralTOF™

The JMS-S3000 is a MALDI-TOF MS incorporating JEOL’s unique Spiral TOF ion optic system. Featuring unprecedented levels of mass resolution and sensitivity, the system has been acknowledged for its distinctive capabilities in many scientific studies.     
The JMS-S3000 is a leading analytical tool, suitable for changing research needs in areas of synthetic polymers, material science, and biological polymers.
JMS-S3000 SpiralTOF™
Additional Specifications Resolution: 60,000 (ACTH fragment 1-17[M+H]+: m/z 2093.1)     
Mass resolution (internal reference): 1 ppm (average error)     
Mass accuracy (external reference): 10 ppm (average error)     
Sensitivity: 500 amol, S/N > 50 with standard stainless steel plate     
Laser: Wavelength 349 nm (maximum 250 Hz)


High mass resolution and sensitivity over a wide molecular weight range     
Since many of synthetic polymers and protein digests have varied molecular weight distributions, analysis of such samples requires high mass resolution and sensitivity in a wide molecular weight range. The JMS-S3000, incorporating JEOL’s unique Spiral TOF ion optic system, is superior to others in these areas.     
Optional linear TOF     
This enables measurement of high molecular weight ions and analysis of samples subject to self-fragmentation.     
Optional TOF/TOF     
This configuration enables MS/MS analysis by high energy collision-induced dissociation. The system, featuring a high precursor ion selection capability, allows the operator to select and monitor only monoisotopic ions in product ion spectral data. It is especially effective for analysis of complex product ion spectra.


JMS-S3000 SpiralTOF™

JMS-S3000 SpiralTOF™

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