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JEOL JSM-IT300HR InTouchScope™ Scanning Electron Microscope

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JSM-IT300HR InTouchScope™ Scanning Electron Microscope

The JSM-IT300HR is a new model of JEOL InTouchScope Series. 
Equipped with a new high-brightness electron gun and optical system, the JSM-IT300HR achieves superbly high-quality imaging and analysis with high sensitivity and high spatial-resolution. This new cutting-edge SEM provides superb performance while maintaining high operability building on the award-winning InTouchScope Series.

Features

High operability: High brightness electron gun for greatly reduced adjustment steps of observation to analysis 
 
Observation: Easy observation even at low accelerating voltage and in low vacuum mode 
Since the JSM-IT300HR provides a high-quality image even at high magnifications of x50,000 to x100,000, fine structures are readily observed. 
Low-voltage imaging and Low-vacuum mode imaging also enable high-quality image observation, so a beam-sensitive specimen is observed with reduced thermal damage and fine structures of an insulating material are readily observed. 
Specimen: Uncoated Cellulose nano-fibers (CNF)?? 
 
Low accelerating voltage 
  • Reduced charging 
  • Reduced thermal damage due to beam irradiation 
     
    Low-vacuum mode and Low accelerating voltage 
  • Reduced charging 
  • Reduced thermal damage due to beam irradiation 
  • High spatial-resolution 
     
    Element analysis: ACL (aperture angle control lens) for smooth element analysis in a sub-micrometer area 
     
    Easier and faster data acquisition 
    ”Smart” touch panel function for intuitive operation is incorporated, which is a feature of InTouchScope Series. Recipes are built in based on specimen category and application. These Recipes automatically set up SEM conditions which are optimized for the observation and analysis of any specimen type. 
     
    The optional Stage Navigation System greatly facilitates searching of the observation field. A fully embedded CCD camera navigates a color image. When double-clicking on the color image, the stage quickly moves to the observation field.
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