FEI Company Helios G4 CX DualBeam™


Helios G4 CX DualBeam™

Access the highest-resolution, multi-scale, and multi-modal subsurface and 3D information 
Subsurface or three-dimensional characterization is often required to better understand the structure and properties of a sample. The latest technological innovations of the FEI Helios G4 CX DualBeam™ microscope, in combination with the easiest to use, most comprehensive software and FEI's application expertise, allow the Helios G4 CX DualBeam with optional AS&V4 software for the highest-quality, fully automated acquisition of multi-modal 3D datasets. Combined with FEI Avizo visualization software, it delivers a unique workflow solution for highest-resolution, advanced 3D characterization and analysis at nanometer scale.


Experience the Advantages of the Helios G4 CX DualBeam 
  • Fastest and easiest preparation of high-quality, site-specific TEM and APT samples using the Tomahawk ion column 
  • Shortest time to nanoscale information using best-in-class Elstar™ electron column 
  • The most complete sample information with sharp, refined, and charge-free contrast obtained from up to 7 integrated in-column and below-the-lens detectors. 
  • The highest quality, multi-modal subsurface and 3D information with the most precise targeting of the region of interest using optional Auto Slice & View™ 4 (AS&V4) software. 
  • Fast, accurate, and precise milling and deposition of complex structures with critical dimensions of less than 10 nm 
  • Precise sample navigation tailored to individual application needs thanks to the high flexibility 110 mm stage and in-chamber Nav-Cam 
  • Artifact-free imaging based on integrated sample cleanliness management and dedicated imaging modes such as SmartScan™
  • Photos

    Manuals and Resources

    Note: We appreciate the support of individuals and companies making their documents and resources available to our community. If you find a document or resource that does not belong please let us know by emailing

    Picture of FEI Company Helios G4 CX DualBeam™
    FEI is a leading diversified scientific instruments company. It is a premier provider of electron and ion-beam microscopes and tools for nanoscale applications...

    More about FEI Company

    Visit FEI Company

    Questions and Answers

    Recent Question Activity

    Be the first to Ask a Question


    Member Reviews

    There are no threads in FEI Company Helios G4 CX DualBeam™ Reviews at this time.
    Add a Review

    FEI Company Helios G4 CX DualBeam™ Articles

    Helpful Resources, Articles, and Information

    Plasma FIB addition to flagship DualBeam can significantly increase milling speed, enabling analyses of larger features that are impractical with...

    See All Related Articles