• 1-2, Musashino 3-chome
  • Akishima
  • Tokyo, JP
  • 196-8558


JEOL is a leading global supplier of scientific instruments used for research and development in the fields of nanotechnology, life sciences, optical communication, forensics, and biotechnology. Utilizing its unique technologies, products, services, and knowledge, JEOL helps its customers make significant breakthroughs in product development and scientific research. JEOL products include scientific instrumentation and industrial equipment, based on five major product groups.

50 JEOL products on LabWrench


Found In: Electron Microscopes

The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs.


Found In: Electron Microscopes

Thermal field emission electron microscope


Found In: Electron Microscopes

JSM-6510 Scanning Electron Microscope; World’s most widely-used family of SEMs!

See all 64 JEOL products on LabWrench

News About JEOL

Image: JEOL Resonance Introduces New Zero Boil Off Magnet for NMR Systems

JEOL Resonance has developed a new Nuclear Magnetic Resonance (NMR) super conducting magnet that operates on a minimum amount of liquid helium. The new NMR system will be announced at the 54th Experimental Nuclear Magnetic Resonance Conference (ENC)...

Image: JEOL High Sensitivity GC-TOF Increases Data Acquisition Speed and Mass Resolving Power

JEOL’s newest AccuTOF GCv model - the “4G” - now offers even faster data acquisition rates and higher resolving power than its predecessor.  The AccuTOF-GCv|4G has a maximum data acquisition rate of 50 spectra per second and a...

Image: NEW JCM-6000 NeoScope II with higher magnification and multi-touch screen control, and a sleek new design

As simple to use as a digital camera, the NeoScope II is a high resolution SEM that produces images with a large depth of field at magnifications ranging from 10X - 60,000X. It offers high & low vacuum operation, three selectable accelerating...

Image: JEOL Introduces Ultra-high Resolution Analytical Field Emission SEM

Highest performance FE-SEM optimized for sub-nm resolution imaging of any type of sample JEOL's new series of field emission scanning electron microscopes is now complete with the introduction of the sub-nanometer imaging resolution...

Image: JEOL Introduces New Versatile FE-SEM Series for Sub-Nanometer Imaging and Analysis of Nanostructures and Magnetic Samples

JEOL launches a new series of Field Emission Scanning Electron Microscopes (FE-SEM) that offer expanded imaging and analysis capabilities customizable to performance requirements.  The JEOL JSM-7100F series offers sub-1 nm imaging capabilities...

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Phosphor Screen

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Remote Operation

I am assuming the scope comes with Windows 7 software,...

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JSM 6610 Gun aligning

Any tips on manually aligning the gun? Struggling ...

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we bought a JEOL nmr ECX 400 and need a field technician ...

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