COLUMBIA, Md., March 13, 2011 — The new EDX-LE from Shimadzu Scientific Instruments is an energy dispersive X-ray (EDX) fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. Its automated analysis functions improve operability without sacrificing a high level of inspection reliability.

The EDX-LE is equipped with a detector that does not require liquid nitrogen, thereby achieving lower operational costs and easier maintenance. It has been optimized for the RoHS/ELV screening of materials, individual parts and other samples that are substantially homogenous. The spectrometer is suited to screening a limited range of samples for fixed control criteria.

The time required from start of measurement to judgment is as short as one minute for some samples. This is very helpful in screening inspections for the five elements (Br, Cd, Cr, Hg and Pb) regulated by the RoHS directive.

Additionally, the EDX-LE offers various features that promote simple screening. Users can customize the easy set-up functions according to the management method. Threshold values can be set for each material or element, and the screening judgment also can be changed according to the input method used for threshold values.

The EDX-LE provides improved security for software operations. The condition protection function lets users set restrictions for screening conditions and other settings. The spectrometer also features an automatic X-ray tube aging function to prevent malfunction in systems that have not been used for long periods of time.