We have estimated the minimum mass required for a particular point in the distribution (e.g. x90) for a required standard error (e.g. 1%) given the top end size of the material and its density. In this presentation we will calculate the best standard error possible with a given mass of sample of known top end size, density given a point in the distribution to be determined. The results may surprise those users with measuring small amounts of material (20mg) with a reasonable top end size (say 200um).


June 13 2019 - June 13 2019
10:30 - 11:30
(GMT-05:00) Eastern [US & Canada]
Event type:
Webinar - Live


Alan Rawle -C.Sci., B.Tech., Ph.D, C.Chem., FRSC
Applications Manager/CoChair E56.02 Characterization SubCommittee of ASTM E56 Committee on Nanotechnology