XRD hands-on learning workshop

X-ray diffraction has undoubtedly been integral towards materials science research. We want to gather the XRD community to share knowledge and gain ideas on how to improve materials research. For the upcoming series of Malvern Panalytical’s XRD workshops across the Asia Pacific region, we have invited our leading specialist, Dr Daniel Lee, to share his knowledge.Can't attend this XRD workshop?

We will be organising this workshop series in Surabaya, Indonesia. For more details, click here



February 24 2020 - February 25 2020
09:00 - 17:00
(GMT+07:00) Asia South East
LIPI Cibinong, Jl. Raya Bogor Km. 46, Cibinong, Bogor, Indonesia, 16911
Event type:


Day 1 Programme:
09.00 - 10.30 Introduction to powder X-ray diffraction: from the theory of Braggs law through to the physics of the X-ray diffractometer
10.30 - 10.45 Coffee / Tea break
10.45 - 11.15 How to collect good quality data: sample preparation for powder sample
11.15 -  11.45 Demo: Running samples on the Aeris compact XRD
11.45 - 12.30 Analysis of sample using Malvern Panalytical's HighScore Plus software *hands-on with your laptop*
- Navigating around the software
- Phase identification tutorial
12.30 - 13.15 Lunch
13.15 - 13.45 Hands-on with Aeris: learn how to operate the Aeris XRD to collect data
- Audience sample 1
- Audience sample 2
13.45 - 14.15 Practical exercise: knowing the difference between good and bad data
14.15 - 14.30 Improving your phase search mapping by defining your elemental range: introduction to elemental analysis using X-ray fluorescence
14.30 - 15.15 Phase identification using HighScore Plus based on audience samples 1 & 2
15.15 - 15.30 Coffee / Tea break
15.30 - 16.00 Opportunity for hands-on with Aeris 
16.00 - 16.15 Recap and questions
16.15 - 17.00 One-on-one sessions with Dr Daniel Lee (book your time slot)
17.00 End

Day 2 Programme
09.00 - 09.45 XRD applications for powders including additive manufacturing, catalysts and launch of the market's intelligent X-ray diffractometer for handling multiple sample types without manual intervention of optics 
09.45 - 10.15 Recap of day 1's phase identification tutorial examples
10.15 - 11.00 Hands-on with Aeris for data collection
- Audience sample 3
- Audience sample 4
11.00 - 11.15 Coffee / Tea break
11.15 - 12.00 Hands-on with HighScore software for data analysis: Phase quantification (using tutorial example)
12.00 - 13.00 Lunch
13.00 - 14.00 Phase quantification based on audience samples 3 & 4
14.00 - 14.45 Rietveld refinement analysis 
14.45 - 15.00 Questions and answer
15.00 - 15.15 Coffee / Tea break
15.15 - 17.00 One-on-one sessions with Dr Daniel Lee (30min time slots available for booking)
17.00 End 


* Each attendee will be given a FREE 90-day trial version of the software.
Attendees are requested to bring their own laptop for this segment. Please note that HighScore is compatible only with Microsoft Windows (not MAC supported).


About Dr Daniel Lee, XRD Application Specialist from Malvern Panalytical Korea's Application Laboratory

Dr Lee studied Material Science in Kyonggi University, South Korea. His areas of expertise are in powder diffraction, PVD, thin film analysis, phosphors, solar cells, lithium ion batteries and thin-flim batteries. Prior to joining Malvern Panalytical in 2013, he had taken on various positions involving energy storage research. He was the Senior Researcher at GS Nanotech for thin film lithium ion batteries (all-solid-state) as well as the Assistant Researcher at Telio Solar Korea's R & D department for CIGS solar cell development.

More information

*Complimentary entry upon registration*

Benefit from our full day interactive learning workshop
- Receive a free 90-day trial version of HighScore Plus software
- Learn the basics of powder XRD
- Pick up tips on how to properly prepare your samples, ensure optimized measurement conditions and good data quality
- Learn how to perform phase identification, quantification and Rietveld refinement 
- Gain confidence with hands-on learning opportunities with the Aeris XRD diffractometer and HighScore Plus software