PANalytical - Axios Advanced

Manufactured by  PANalytical
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4 kW WD XRF

AxiosmAX-Advanced is engineered for excellence in terms of analytical and operational performance. Technological innovation combined with decades of experience has resulted in the AxiosmAX-Advanced  the ultimate system for accurate and precise XRF analysis.
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Features of Axios Advanced

SST-mAX50 breakthrough technology

AxiosmAX-Advanced is equipped with SST-mAX50 – the newest technology in high power, end-window X-ray tubes. SST-mAX50 features a special ultra-thin window, which combined with 4 kW power and 160 mA operation gives the highest sensitivity and lowest detection limits for light elements. While ZETA Technology maintains the benefit of ultimate light-element sensitivity over time, CHI-BLUE coating technology increases the robustness and durability of the SST-mAX50 throughout its lifetime.

Advanced software for routine flexibility

AxiosmAX-Advanced is controlled by SuperQ, PANalytical's established and proven XRF analysis software. With an intuitive user interface, it allows operators to perform advanced analysis. Powerful and flexible, SuperQ also gives R&D analysts complete control over every aspect of the analysis. Optional modules are available to extend the functionality for dedicated types of analysis, such as low-level trace element and thin-layer analysis, enhanced data security and laboratory automation – SuperQ's software modules give you the analytical advantage.

Full investigations within 1 minute

The versatile Omnian standardless analysis software can handle a wide variety of sample materials including rocks, ores, steels, plastics and oils. All are analyzed by a single measuring program, calibrated using PANalytical's advanced fundamental parameters algorithm. Omnian coupled with the unique FastScan capability of your AxiosmAX can deliver a quantitative measurement within one minute.

Analytical flexibility and speed

A 6-position collimator mask gives AxiosmAX-Advanced the flexibility to handle a wide variety of sample diameters from 6 mm to 37 mm. The mask is programmable, allowing AxiosmAX-Advanced to measure samples of different sizes in a single measurement batch. Continuous and direct sample loading options minimize instrument overhead time and greatly speed sample throughput.

Light element sensitivity

In addition to its unique thin window technology, the unparalleled light-element performance of the SST-mAX50 is further enhanced by the use of laterally curved crystals (GE111, PE002), which have outstanding sensitivity and spectral resolution for S, P, Si and Al. Element-specific, high-reflectivity multi-layer crystals are optional for the analysis of Be, B, C and N, with the new PX7 crystal yielding 50% more sensitivity for boron.

Enhanced performance

Whether you require the ultimate in precision, speed or durability, AxiosmAX-Advanced can be further enhanced with a range of hardware and software options to fulfill your needs. Dedicated high-performance (Hi-Per) channels for light element analysis boost both precision and sample throughput, whereas PANalytical's unique duplex detector boosts sensitivities for transition metals.

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