Xenemetrix's EX-6600 SDD Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer offers the ultimate in sensitivity and selectivity. The Silicon Drift Detector (SDD) simultaneously delivers lower electronic noise and higher count rates which translates to higher energy resolution and fast results compared to a Si-PIN detection system. Eight secondary targets provide maximum sensitivity for fast and precise quantification even in difficult matrices such as alloy, plastic and geological samples. Targets are fully customizable to achieve sub-ppm detection limits. The versatile EX-6600 SDD can analyze liquids, solids, slurries, powders, pellets and air filters and the analytical chamber accomodates samples of different shapes and sizes.       
       
The integral design of the ten-position auto-sampler permits minimal operator intervention and allows automatic loading and unattended operation - offering the most efficient throughput of samples. This fast, accurate, easy-to-use instrument has robust hardware and powerful analytical software to achieve low detection limits. The Multi-Channel Acquisition resolution provides superior peak-to-background ratio for improved detector response.     
     
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EX-6600 EDXRF Spectrometer Information Page