FEI Company - Titan™ G2 80-200 with ChemiSTEM™ Technology
Manufactured by FEI Company
Material Science, especially recent developments in nanotechnology, requires imaging capabilities down to the atomic...
Material Science, especially recent developments in nanotechnology, requires imaging capabilities down to the atomic level as well as chemical identification of different components with atomic resolution. The Titan G2 80-200 is a S/TEM (scanning transmission electron microscope) that meets these needs by combining the Titan platform’s latest generation of corrected electron optics with the revolutionary analytical sensitivity of the ChemiSTEM Technology.
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Features of Titan™ G2 80-200 with ChemiSTEM™ Technology
- Revolutionary ChemiSTEM Technology for atomic-level elemental mapping and ultrasensitive fast mapping of a large range of the periodic table
- 80 pm STEM or 90 pm in TEM resolution with Titan G2 series aberration corrected electron optics and platform stability
- Maximize your coherence and brightness of the electron source with the unmatched performance of the ultra stable X-FEG electron gun
- Large space at the specimen area suited for special holders and high-tilts required for tomography and crystal orientations
- ChemiSTEM Tomography: EDX Tomography is practical for the first time using the 3D architecture of 4 SDDs positioned around the sample
General Specifications
| Microscope Type | Electron |
