FEI Company - Titan ETEM G2
Manufactured by FEI Company
Titan™ ETEM G2 is a dedicated environmental TEM, designed for in situ chemical reactions and catalysis experiments
FEI’s Titan ETEM G2 atomic-resolution Scanning/Transmission Electron Microscope
(STEM) is an all-in-one solution for time-resolved in situ studies of dynamic behavior of
nanomaterials during exposure to reactive gas environments and elevated temperatures.
Built on the world class Titan TEM platform, which delivers the ultimate performance in
mechanical, electronic and thermal stability, Titan ETEM is a flexible solution for imaging
of static specimens, observations of nanomaterials’ dynamic response to the applied
stimulus (gas and temperature), observations of growth (kinetics) as well as function,
reliability and breakdown studies of nanodevices. Titan ETEM can be combined with
optional image Cs corrector, FEI’s X-FEG module and monochromator technology to
further extend it to meet the high standards in atomic-resolution S/TEM imaging
and spectroscopy expected from FEI’s Titan 80-300 kV technology.
(STEM) is an all-in-one solution for time-resolved in situ studies of dynamic behavior of
nanomaterials during exposure to reactive gas environments and elevated temperatures.
Built on the world class Titan TEM platform, which delivers the ultimate performance in
mechanical, electronic and thermal stability, Titan ETEM is a flexible solution for imaging
of static specimens, observations of nanomaterials’ dynamic response to the applied
stimulus (gas and temperature), observations of growth (kinetics) as well as function,
reliability and breakdown studies of nanodevices. Titan ETEM can be combined with
optional image Cs corrector, FEI’s X-FEG module and monochromator technology to
further extend it to meet the high standards in atomic-resolution S/TEM imaging
and spectroscopy expected from FEI’s Titan 80-300 kV technology.
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Features of Titan ETEM G2
- Redesigned ETEM user interface and full software control of all operational parameters
- Rapid interchange between ETEM and high vacuum mode
- Large polepiece gap allows full tilt capability of the specimen holder for optimal orientation and electron tomography
- Compact and bakeable gas inlet system
- Linear gas flow regimen to minimize cross-contamination
- Built-in protection assures a safe working environment and safe use of flammable gases
General Specifications
Electron Microscope Type | TEM |
Probe Current | 0.6 nA |
Resolution (nm) | 0.2 nm (standard mode, no corrector) |
Microscope Type | Electron |
Additional Specifications
TEM information limit (nm): = 0.1 (mono on, standard, no corrector), = 0.09 (mono on, standard, Cs image corrected), = 0.12 (mono on, ETEM mode, no corrector & with Cs image corrected)
System energy resolution: = 0.7 eV (standard), = 0.8 eV (ETEM mode)