JEOL - JCM-6000 NeoScope
Manufactured by JEOL
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A desktop scanning electron microscope
The NeoScope II is a high resolution SEM that produces images with a large depth of field at magnifications ranging from 10X - 60,000X. It offers high & low vacuum operation, three selectable accelerating voltages, secondary electron, and back-scattered electron imaging. The NeoScope II accommodates samples up to 70mm in diameter and 50mm in thickness. The NeoScope examines both conductive and non-conductive samples without any special sample preparation. Optional EDS is available for elemental analysis.
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Features of JCM-6000 NeoScope
- High performance system in a compact, innovative model
- Intuitive touch panel operation with new GUI
- Well focused 3D morphological observation
- Backscattered electron imaging for compositional distribution
- Metrology supported
- Imaging of tilted, rotated samples (optional)
- Compact body equal to an optical microscope
- Simple, stylish body
- Touch panel with new GUI. More intuitive operation
- Dual frame display
- Element analysis
General Specifications
| Depth | 490 mm |
| Magnification | 10 to 60000 x |
| Height | 430 mm |
| Electron Microscope Type | SEM |
| Width | 330 mm |
| Power Requirements | Single phase AC 100 V (700 VA), 120 V (840 VA), 220 V (880 VA). 240 V (960 VA) |
| Microscope Type | Electron |
Additional Specifications
Magnification: 10 to 30,000x (Backscattered electron image)
Accelerating voltage: 3 stages; 15 kV/10 kV/5 kV (Secondary electron image) & 2 stages; 15 kV/10 kV(Backscattered electron image)
Imaging modes: High Vacuum/Low Vacuum
Electron gun: Small grid gun integrating filament and wehnelt
Specimen stage: X-Y manual control; X: 35 mm; Y: 35 mm
Maximum specimen size: Diameter 70 mm, height 50 mm
Data display: Accelerating voltage, magnification, µ bar, µ value, etc.