Bruker AXS - Dimension® Edge™
The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance,...
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Features of Dimension® Edge™
Best Value Closed-Loop Dimension AFM
Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels * Reduced noise and drift bring small-sample imaging performance to large-sample AFM * Microscope and electronics design enable high image fidelity at moderate cost
Accurate, High-Resolution Results Even Faster * Linear workflow with visual feedback ensure optimized setup in shortest time * Camera and stage provide best sample navigation and multi-site measurements * Seamless transitions from survey to highest resolution deliver fast, accurate results
Solutions for All Applications on Any Sample * Open stage access accommodates wide variety of experiments and samples * Optimized AFM modes and techniques meet needs of even advanced applications * Built-in access to signal routing enables custom measurements
Advanced Nanoscale Capabilities For Beginners and Experts * Innovative, modular system design provides high performance at moderate cost * Experiment-selection modes distill decades of AFM expertise into preconfigured settings * Integrated stage control enables intuitive navigation and powerful stage programming
General Specifications
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