Bruker AXS - Dimension® Icon®

Manufactured by  Bruker AXS
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The Dimension® Icon® Atomic Force Microscope with ScanAsyst™ brings new levels of performance, functionality, and...

The Dimension® Icon® Atomic Force Microscope with ScanAsyst™ brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world's most utilized large-sample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback and industry-leading application flexibility. The Icon has been designed from top to bottom to deliver revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours, enabling increased productivity. 
 
AFM Performance and Productivity Redefined
 
 
Incorporating the latest evolution of Bruker’s industry-leading tip-scanning AFM technology, the Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the noise performance of most open-loop, high-resolution AFMs.
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Features of Dimension® Icon®

In addition to superior resolution, many of the Icon’s new features are designed specifically to increase usability and productivity for both new and expert AFM researchers: 

  • Proprietary sensor design achieves closed-loop performance with open-loop noise levels for previously unseen resolution on large-sample AFMs * New-design XYZ closed-loop head delivers higher scan speed, without loss of image quality, enabling greater throughput for data collection * Latest version of NanoScope software offers an intuitive workflow and default experiment modes that distill advanced AFM processes into preconfigured settings * High-resolution camera and X-Y positioning permit faster, more efficient sample navigation * Wide-open access to the tip and sample accommodates a large variety of standard and customized experiments * Hardware and software take the fullest advantage of all current and future Bruker AFM modes and techniques, including our revolutionary HarmoniX Nanoscale Material Property Mapping mode
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