FEI Company - Helios Nano Lab 660
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Especially well-suited for a wider range of materials including soft or delicate ones, like metals, polymers, nanotubes, particles or ceramics, the He
The Helios NanoLab 660 DualBeam SEM/FIB accelerates discovery by revealing the finest nanoscale details in 2D and 3D images with clearest contrast, creating complex functional nano devices over millimeters, and preparing the thinnest and highest quality samples to access the most accurate atomic information. Especially well-suited for a wider range of materials including soft or delicate ones, like metals, polymers, nanotubes, particles or ceramics.
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Features of Helios Nano Lab 660
The Helios NanoLab 660 supports:
- Sub-nm SEM imaging with perfect topographic and materials contrast: FEI’s extreme high resolution (XHR) SEM allows —quickly and easily— to simultaneously collect and select the right signals to reveal the smallest of details in material surfaces or cross sections * High resolution 3D characterization: reveal morphology, elemental composition and structure, or collect crystallographic information across multiple scales—with automated slice and view techniques * Rapid creation of complex micro and nano scale devices, over millimeters: turn your ideas into functional prototypes of MEMS/NEMS, fluidic or photonic devices, even AFM tips, and validate designs before moving to fabrication * Fast preparation of the thinnest, highest quality samples, allowing for high resolution S/TEM and atom probe microscopy to get your atomic scale research off to the best possible start.
General Specifications
| Microscope Type | Electron |