JASCO - MSV-300 Series
Manufactured by JASCO
Provides transmittance/reflectance measurements of microscopic sample sites for a wide range of wavelengths, from the ultraviolet to the near infrared
The MSV-300 series is a microspectroscopy system that enables transmittance/reflectance
measurements for microscopic samples and sites in a wide range of wavelengths from ultraviolet to near infrared. Conventionally, only a macroscopic analysis was available to test samples whose dimensions were comparable to a mm-sized probe beam. The MSV-300 series as enabled measurements of such properties as color, film thickness, and spectral properties using an actual patterned sample or a microscopic sample. In addition, combining the system with an automatic stage allows the user to perform multi-point measurements and surface analysis.
measurements for microscopic samples and sites in a wide range of wavelengths from ultraviolet to near infrared. Conventionally, only a macroscopic analysis was available to test samples whose dimensions were comparable to a mm-sized probe beam. The MSV-300 series as enabled measurements of such properties as color, film thickness, and spectral properties using an actual patterned sample or a microscopic sample. In addition, combining the system with an automatic stage allows the user to perform multi-point measurements and surface analysis.
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Features of MSV-300 Series
Wide measurement range
Enables continuous measurement in a wide range between 250 and 2,000 nm (MSV-370) by the use of a spectrometer supporting a wide band, Cassegrain type objective mirror.
Superb operability
A CCD camera is built into the microscope as standard equipment, allowing you to check sample position and set the aperture using a monitor.
Double-beam system
The optics deliver superb measurement stability by the use of a doublebeam system.
Support for an automatic stage
Attaching an optional automatic stage enables the easy setting of measurement points using a mouse while watching the monitor. Mapping measurements are also possible.
General Specifications
There are no General Specifications available.
Series Modals
JASCO - MSV-350
[+] View Model Specifications| Bandwidth | 1, 2, 5, 10 nm |
| Depth | 700 mm |
| Detector | Photomultiplier |
| Height | 650 mm |
| Width | 750 mm |
| Power Requirements | 210 VA |
| Optical System | Double-beam single monochromator system, Czerny-Turner mount optics |
| Weight | 130 kg |
| Wavelength Range | 250 to 800 nm |
| Light Source | Deuterium lamp and halogen lamp (automatic switching) |
| Additional Model Specifications | Wavelength accuracy: ±0.3 nm
Wavelength reproducibility: ±0.1 nm Sample observation: Using video camera, dual lens barrel and sample observation polarizer (option) Objective: Cassegrain-type objective mirror (10×~, 16×~, and 32×~ magnification, 16×~ or 32×~ is standard. The others are optional.) Sampling area: From 30 µm × 30 µm (Measurement conditions: When using Cassegrain magnification (×32), 10 (40 in Near Infrared) nm spectral bandwidth) Photometry modes: %T, %R, Abs, Sam, Ref Measurement modes: Spectral measurement, time course measurement, and fixed wavelength measurement Polarizer/analyzer: Glan-Taylor prism (option) Control/data processing: 32-bit AT compatible (Spectra Manager) Sample stage: Manual (An automatic stage is optional) Optional programs: Mapping measurement program, film thickness calculation program, and color diagnosis program Base: Base mounted in standard configuration |
JASCO - MSV-370
[+] View Model Specifications| Bandwidth | 1, 2, 5, 10 nm (2, 4, 8, 20, 40 nm)* |
| Depth | 700 mm |
| Detector | Photomultiplier and PbS detector (automatic switching)* |
| Height | 650 mm |
| Width | 750 mm |
| Power Requirements | 210 VA |
| Optical System | Double-beam single monochromator system, Czerny-Turner mount optics |
| Weight | 130 kg |
| Wavelength Range | 250 to 2000 nm |
| Light Source | Deuterium lamp and halogen lamp (automatic switching) |
| Additional Model Specifications | Wavelength accuracy: ±0.3 nm
Wavelength reproducibility: ±0.1 nm (±0.4 nm)* Sample observation: Using video camera, dual lens barrel and sample observation polarizer (option) Objective: Cassegrain-type objective mirror (10×~, 16×~, and 32×~ magnification, 16×~ or 32×~ is standard. The others are optional.) Sampling area: From 30 µm × 30 µm (Measurement conditions: When using Cassegrain magnification (×32), 10 (40 in Near Infrared) nm spectral bandwidth) Photometry modes: %T, %R, Abs, Sam, Ref Measurement modes: Spectral measurement, time course measurement, and fixed wavelength measurement Polarizer/analyzer: Glan-Taylor prism (option) Control/data processing: 32-bit AT compatible (Spectra Manager) Sample stage: Manual (An automatic stage is optional) Optional programs: Mapping measurement program, film thickness calculation program, and color diagnosis program Base: Base mounted in standard configuration [i]* The specifications within parentheses are for the near-infrared range.[/i] |
