JASCO - NFS-200/300 Series
Manufactured by JASCO
NFS-200 / 300 Near-Field Spectrometer
JASCO is the first company to introduce a commercially available integrated Near-Field Scanning Optical Spectrometer for Photoluminesence measurements.
The room-temperature NFS-200 and ultra-low temperature (~6K) NFS-300 systems represent a major breakthrough in spectroscopic spatial resolution allowing sub-wavelength optical measurements from the sample while simultaneously mapping high resolution topography.
Key to the performance of the NFS systems are the high quality near field optical probes made by an exclusive process to produce consistent shape and apertures required for reliable NSOM measurements. Jasco probes be optimized for resolution or throughput and can be used with a variety of NSOM instruments. Probes are available for the UV through NIR region and can be custom manufactured to meet specific needs.
The NFS-210/310 series is a near-field microscopy system incorporating a feedback mechanism for controlling the distance between the near-field probe and sample surface with a telescope for observation of the sample and probe interface. Laser excitation sources or detectors are not included but a variety of experimental systems can be built by using the access windows on the front and right side of the unit. In addition, direct access to the end of the optical fiber in the near-field probe allows greater flexibility for basic experiments using the near-field microscope system.The sample stage is controlled with exacting precision such that the probe tip remains at a fixed distance from the sample surface, the control movements providing accurate topographical information for the sample surface.
The NFS-220/320 series combines the precision of the NFS near-field microscope system with the additional excitation optics to expose samples to near-field light emitted from the tip of the near-field probe. In addition to topographical maps of the sample surface with a spatial resolution beyond a conventional microscope, the precise control of the distance between the probe tip and sample surface provides optimal illumination for optical nanofabrication applications.
The NFS-230/330 series is an integrated near-field spectrometer system providing fluorescence and photoluminescence spectra with extremely high spatial resolution. The topographical mapping capabilities of near-field and precision control of the distance between the probe tip and sample surface can be used to provide controlled excitation of a submicroscopic region on the sample surface, providing fluorescence and photoluminescence data with a spatial resolution orders of magnitude greater than conventional microscopy.
The room-temperature NFS-200 and ultra-low temperature (~6K) NFS-300 systems represent a major breakthrough in spectroscopic spatial resolution allowing sub-wavelength optical measurements from the sample while simultaneously mapping high resolution topography.
Key to the performance of the NFS systems are the high quality near field optical probes made by an exclusive process to produce consistent shape and apertures required for reliable NSOM measurements. Jasco probes be optimized for resolution or throughput and can be used with a variety of NSOM instruments. Probes are available for the UV through NIR region and can be custom manufactured to meet specific needs.
The NFS-210/310 series is a near-field microscopy system incorporating a feedback mechanism for controlling the distance between the near-field probe and sample surface with a telescope for observation of the sample and probe interface. Laser excitation sources or detectors are not included but a variety of experimental systems can be built by using the access windows on the front and right side of the unit. In addition, direct access to the end of the optical fiber in the near-field probe allows greater flexibility for basic experiments using the near-field microscope system.The sample stage is controlled with exacting precision such that the probe tip remains at a fixed distance from the sample surface, the control movements providing accurate topographical information for the sample surface.
The NFS-220/320 series combines the precision of the NFS near-field microscope system with the additional excitation optics to expose samples to near-field light emitted from the tip of the near-field probe. In addition to topographical maps of the sample surface with a spatial resolution beyond a conventional microscope, the precise control of the distance between the probe tip and sample surface provides optimal illumination for optical nanofabrication applications.
The NFS-230/330 series is an integrated near-field spectrometer system providing fluorescence and photoluminescence spectra with extremely high spatial resolution. The topographical mapping capabilities of near-field and precision control of the distance between the probe tip and sample surface can be used to provide controlled excitation of a submicroscopic region on the sample surface, providing fluorescence and photoluminescence data with a spatial resolution orders of magnitude greater than conventional microscopy.
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Features of NFS-200/300 Series
NFS-210/310
- Integrated near-field microscope with high mechanical stability.
- Sample illumination and detection access from two sides (front and right).
- Direct access to optical fiber of the near-field probe.
- Topographic mapping of almost any sample; organic, inorganic, metal or biopolymer, etc.
- For low temperature experiments, the NFS-310 includes a He gas-flow cryostat for cooling to 10K or less.
- A compact footprint for an existing vibration isolation
- Controlled illumination of samples with a spatial resolution of several hundred nm or less using the nearfield probe.
- Topographic mapping of almost any sample; organic, inorganic, metal or biopolymer, etc.
- For low temperature experiments, the NFS-320 includes a He gas-flow cryostat for cooling to 10K or less.
- Parallel beam output port for light condensed by the nearfield probe.
- Integrated laser source.
- Optional laser excitation with external laser port.
- The NFS-220T and -320T are bench-top models; the NFS-220V and -320V are supplied with a vibration isolation table.
- An integrated near-field microspectrometer system.
- Measurement of fluorescence/photoluminescence spectra at high spatial resolutions from 50 to 1000 nm.
- Topographic mapping of almost any sample; organic, inorganic, metal or biopolymer, etc.
- For low temperature experiments, the NFS-330 includes a He gas-flow cryostat for cooling to 10K or less.
- Automated switching of illumination/collection modes, excitation sources and filters.
- The NFS-230T and -330T can be integrated onto an existing platform; the NFS-230V and -330V are supplied with a vibration isolation table.
General Specifications
There are no General Specifications available.
Series Modals
JASCO - NFS-210
[+] View Model Specifications| Depth | 520 mm |
| Height | 550 mm |
| Width | 340 mm |
| Power Requirements | 100 V AC ± 10%, 250 VA (Excluding PC and laser) |
| Weight | 45 kg |
| Additional Model Specifications | Spatial resolution: Aperture diameter (or less) of nearfield probe (1000 – 50 nm)
Stage range: 20 x 20 microns (room temp.), 5 x 5 microns (low temp) Height: 8 microns (room temp.), 2 microns (low temp.) Control PC: Windows2000/XP OS Communication: 16-bit ADC Image acquisition: Video capture Software: Feedback signal monitor and nearfield mapping measurement software, 3D display software, CCD image display for probe observation, mapping analysis software, spectral analysis software Sample cooling: Gas-flow cryostat (NFS-310) User access port: 2 ports (Front and right side) Power Supply Dimensions: 335 x 450 x 140 mm (W x D x H) Weight, Power Supply: 15 kg |
JASCO - NFS-220
[+] View Model Specifications| Depth | 680 mm |
| Height | 550 mm |
| Width | 710 mm |
| Power Requirements | 100 V AC ±10%, 250 VA (Excluding PC and laser) |
| Weight | 70 kg |
| Additional Model Specifications | Measurement modes: Illumination-collection, collection, and illumination (transmission)
Built-in laser: 532 nm source standard, or optional 632.8 nm excitation External laser: Capability for two excitation sources (including internal source) Spatial resolution: Aperture diameter (or less) of nearfield probe (1000 – 50 nm) Stage range: 20 x 20 microns (room temp.), 5 x 5 microns (low temp) Height: 8 microns (room temp.), 2 microns (low temp.) Control PC: Windows2000/XP OS Communication: 16-bit ADC Image acquisition: Video capture Software: Feedback signal monitor and near-field mapping measurement software, 3D display software, CCD image display for probe observation, mapping analysis software, spectral analysis software Sample cooling: Gas-flow cryostat (NFS-320) Weight, Power Supply: 335 x 450 x 140 mm (W x D x H) Weight, Controller: 15 kg Vibration isolation table: 280 kg Other requirements: Nitrogen or air source for vibration isolation table, 0.3 to 0.8 MPa (50-100 psi). |
JASCO - NFS-230
[+] View Model Specifications| Depth | 680 mm |
| Height | 550 mm |
| Width | 710 mm |
| Power Requirements | 100 V AC ±10%, 250 VA (Excluding PC and laser) |
| Optical System | Aberration-corrected Czerny-Turner spectrometer |
| Weight | 90 kg |
| Wavelength Range | 500 to 1000 nm |
| Additional Model Specifications | Measurement modes: Illumination-collection, collection, and illumination
(transmission) Internal laser source: 532 nm source standard, or optional 632.8 nm excitation External laser port: Capability for two excitation sources (including internal source) Focal length: 300 mm Diffraction gratings: Standard gratings of 1,800 lines/mm and 600 lines/mm Wavelength resolution: 0.5 nm or greater Detector: Thermoelectric or liquid nitrogen-cooled multichannel CCD detector Spatial resolution: Aperture diameter (or less) of near-field probe (1000 – 50 nm) Stage range: 20 x 20 microns (room temp.), 5 x 5 microns (cryostat) Height: 8 microns (room temp.), 2 microns (cryostat) Control PC: Windows 2000/XP OS Communication: 16-bit ADC Image acquisition: Video capture Software: Feedback signal monitor and near-field mapping measurement software, 3D display software, CCD image display software for probe observation, mapping analysis software, spectral analysis software Sample cooling: Gas-flow cryostat (NFS-330) Dimensions, Power Supply: 335 x 450 x 140 mm (W x D x H) Weight, Power Supply: 15 kg Weight, Vibration isolation table: 280 kg Other requirements: Nitrogen or air source for vibration isolation table, 0.3 to 0.8 MPa (50-100 psi). |
JASCO - NFS-310
[+] View Model Specifications| Depth | 520 mm |
| Height | 750 mm |
| Width | 340 mm |
| Power Requirements | 100 V AC ± 10%, 250 VA (Excluding PC and laser) |
| Weight | 45 kg |
| Additional Model Specifications | Spatial resolution: Aperture diameter (or less) of nearfield probe (1000 – 50 nm)
Stage range: 20 x 20 microns (room temp.), 5 x 5 microns (low temp) Height: 8 microns (room temp.), 2 microns (low temp.) Control PC: Windows2000/XP OS Communication: 16-bit ADC Image acquisition: Video capture Software: Feedback signal monitor and nearfield mapping measurement software, 3D display software, CCD image display for probe observation, mapping analysis software, spectral analysis software Sample cooling: Gas-flow cryostat (NFS-310) User access port: 2 ports (Front and right side) Power Supply Dimensions: 335 x 450 x 140 mm (W x D x H) Weight, Power Supply: 15 kg |
JASCO - NSF-330
[+] View Model Specifications| Depth | 680 mm |
| Detector | Thermoelectric or liquid nitrogen-cooled multichannel CCD detector |
| Height | 750 mm |
| Width | 710 mm |
| Power Requirements | 100 V AC ±10%, 250 VA (Excluding PC and laser) |
| Optical System | Aberration-corrected Czerny-Turner spectrometer |
| Weight | 90 kg |
| Additional Model Specifications | Measurement modes: Illumination-collection, collection, and illumination
(transmission) Internal laser source: 532 nm source standard, or optional 632.8 nm excitation External laser port: Capability for two excitation sources (including internal source) Focal length: 300 mm Diffraction gratings: Standard gratings of 1,800 lines/mm and 600 lines/mm Wavelength resolution: 0.5 nm or greater Spatial resolution: Aperture diameter (or less) of near-field probe (1000 – 50 nm) Stage range: 20 x 20 microns (room temp.), 5 x 5 microns (cryostat) Height: 8 microns (room temp.), 2 microns (cryostat) Control PC: Windows 2000/XP OS Communication: 16-bit ADC Image acquisition: Video capture Software: Feedback signal monitor and near-field mapping measurement software, 3D display software, CCD image display software for probe observation, mapping analysis software, spectral analysis software Sample cooling: Gas-flow cryostat (NFS-330) Dimensions, Power Supply: 335 x 450 x 140 mm (W x D x H) Weight, Power Supply: 15 kg Weight, Vibration isolation table: 280 kg Other requirements: Nitrogen or air source for vibration isolation table, 0.3 to 0.8 MPa (50-100 psi). |