HP - 5972
Manufactured by HP
GC/MSD System
HP 5972 system uses electron impact (EI) ionization and is capable of performing full mass scans or selective ion monitoring (SIM).
Mass Spectrometer:
Full Scan:
Mass Range: 1.6-700 amu
Scan Speed: Up to 1800 amu/sec with 1 amu resolution
Sensitivity: 10pg of Hexachlorobenzene yields a signal to noise of >10:1
Selective Ion Monitoring:
Mass Range: Up to 50 groups of 30 masses/group
Sensitivity: 200fg of Hexachlorobezene yields a signal to noise of >10:1
Mass Spectrometer:
Full Scan:
Mass Range: 1.6-700 amu
Scan Speed: Up to 1800 amu/sec with 1 amu resolution
Sensitivity: 10pg of Hexachlorobenzene yields a signal to noise of >10:1
Selective Ion Monitoring:
Mass Range: Up to 50 groups of 30 masses/group
Sensitivity: 200fg of Hexachlorobezene yields a signal to noise of >10:1
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Documents & Manuals
There are no Documents or Manuals available.
Features of 5972
- Lower noise by factor of 5X.
- Run at lower Emission current 35uA (similar to 5972-5973).
- Use 5972/73 filament.
- Able to tune in higher repeller voltage (similar to 5972-5973).
- Mass range: Extended to 700 AMU
General Specifications
There are no General Specifications available.