Netzsch - LFA 467 HyperFlash

Manufactured by  Netzsch
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New Dimensions in the Measurement of Thermal Diffusivity and Conductivity – Fast, Simple, Economical

With a single instrument setup – that is, without having to swap out either the detector or the furnace – the LFA 467 HyperFlash can carry out measurements from -100°C to 500°C. Coupled with the broadest range of accessories available on the market, the instrument opens the door to completely new dimensions in the determination of thermophysical properties.
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Features of LFA 467 HyperFlash

Sample throughput up to 4 times higher due to sample holder for 16 samples    One unique advantage of the LFA 467 HyperFlash is its ability to simultaneously measure up to 16 samples over the entire temperature range. This allows for maximum sample throughput with a minimum input of operational time and effort.    Refill systems are available for automatic refilling of the Dewar on both the detector and the furnace, allowing uninterrupted operation of the LFA system around the clock.   

ZoomOptics for more precise measurement results without measurement errors    The patent-pending ZoomOptics system optimizes the field of view of the detector, thus eliminating any influences caused by aperture stops. The result is a significant increase in the precision of the measurement results.

General Specifications

There are no General Specifications available.

Additional Specifications

Temperature range:    
-100°C to 500°C, with only one single furnace   

  • Xenon flash lamp with max. 10 J/Pulse (variable)   
  • Contactless measurement of the temperature increase with IR detector   
    Data acquisition rate:    
    up to 2 MHz (for both temperature detection and pulse mapping) – allows for measurement times (corresponds to 10 half times) down to 1 ms for highly conductive or very thin samples (min. thickness 0.01 mm, dependent upon sample properties)   
    Measuring range thermal diffusivity:    
    0.01 mm2/s to 1000 mm2/s   
    Measuring range thermal conductivity:    
    < 0.1 W/(mK) to 2000 W/(mK)   
    Sample dimensions:   
    - 6 mm to 25.4 mm diameter (also for square samples),   
    - 0.01 mm to 6 mm thickness (actual upper and lower limits of the sample’s thickness depend on the sample properties)   
  • Automatic sample changer for up to 16 samples   
  • More than 20 different sample holders available   
  • ZoomOptics for optimization of the detector’s field of view (patent-pending)   
  • Patented pulse mapping technique (US 7038209, US 20040079886, DE 10242741 – approximation of the pulse) for pulse length correction and improved cp determination   
    Atmospheres: inert, oxidizing, static/dynamic, reduced pressure
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