Features optics and signal detection systems affording unparalleled imaging and analytical performance.
The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.
- Unparalleled Image Quality—All new electron optics design with best-in-class image sharpness
- Intuitive Operation—Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology
- Ultra Variable-Pressure Detector—Image surface information at low vacuum and low accelerating voltages
- Stereoscopic Image Function—Point and click for seamless, real-time "3D" image observation
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Features of SU3500
Fast Auto Imaging
“Best-in-class” Auto Start Functions (Focus, Brightness, Contrast, and Stigmation) for unmatched ease of operation and efficiency.
Low kV and Low Vacuum Performance
Hitachi “Hex-Bias” probe current optimization combined with the all new Ultra Variable-Pressure (UVD) detector offer superior imaging and surface information at low accelerating voltages and low vacuum.
Live Stereoscopic Imaging
Advanced tilted-beam-scan technology enable Point and click, real-time “3D” image observation. (show 3D pictures from flyer)
|Electron Microscope Type||SEM|
|Resolution (nm)||10 nm|
Column unit: 740 W x 1,000 D x 1,550 H (mm), 450kg
Display unit: 1,000 W x 1,000 D x 730 H (mm), 153kg
Rotary pump: 526 W x 225 D x 306 H (mm), 28kg
Air compressor: 415 W x 210 D 515 H (mm), 18kg
Weight: 200 W x 180 D x 160 H (mm), 40kg