JEOL - JSM-IT300LV

Manufactured by  JEOL
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The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs.

The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs. This all-new design builds upon the award-winning platform of the InTouchScope™ analytical SEM with intuitive touch screen control, and supersedes the widely used high-performance analytical SEM, the JSM-6610LV.        
       
Throughout the evolution of this popular SEM family, JEOL has continued to enhance features and capabilities to offer the best possible imaging resolution, versatility, and operator interface. With a high resolution of 3.0nm at 30kV and unsurpassed low kV performance, the JSM-IT300LV delivers amazing clarity for imaging the finest structures.       
       
Versatility and high resolution across the magnification range of 5X - 300,000X are the hallmarks of the JEOL tungsten SEM family, and the JSM-IT300LV brings that capability to its highest level of performance today.
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Features of JSM-IT300LV
  • Extended vacuum range to 650 Pa       * New vacuum design with through the lens pumping       * Improved electron optics with new features (CF scan, high current mode)       * Multiple ports - smart analytical geometry       * Large analytical chamber and specimen stage can support samples as large as 300mm in diameter       * New intuitive multi-touch software interface        * High resolution imaging with tungsten source (LaB6 Option)       * Mechanically eucentric 5-axis motorized stage with asynchronous movement       * Navigation from a color image built in       * Multi-element solid state BSE detector standard on LV models with high sensitivity at low kV or fast scan rates. (LV SE detector Option)       * Smart settings for common samples (create/store/recall)       * Multiple Live Imaging (including Picture in Picture and signal mixing)        * ideo capture built in (AVI format)
General Specifications
Magnification5 to 300000 x
Electron Microscope TypeSEM
Resolution (nm)4 nm
Microscope TypeElectron
Additional Specifications

Filament    
Pre-centered W hairpin filament (with continuous auto bias)   
Resolution    
High Vacuum mode: 3.0 nm (30kV), 8nm (3kV), 15nm (1kV)   
Low Vacuum mode: 4.0 nm (30kV)   
Accelerating Voltage    
300v to 30 kV   
Magnification    
x5 to 300,000 (printed as a 128mm x 96mm micrograph)   
LV Detector    
Multi-segment BSED (std.)   
LV-SED (option)   
LV Pressure    
10 to 650 Pa   
Maximum Specimen Size    
Observation: 178mm diameter, Maximum loadable: 300mm, Height: 80mm   
Specimen Stage 5 axis motor control with asynchronous movement   
Eucentric goniometer   
X=125mm, Y=100mm, Z=5 to 80mm   
T= -10 to 90°, R=360° (endless)   
Stage Navigation System    
Embedded Color CCD Camera for Sample Navigation   
Frame Store    
Up to 5120×3840 pixels

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