Tescan - RISE Microscope
Manufactured by Tescan
Correlative Raman Imaging and Scanning Electron Microscopy World's first fully-integrated Raman Imaging and Scanning Electron Microscope
RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
The RISE Microscope combines all features of a stand-alone SEM and the confocal Raman imaging microscope alpha300 within one instrument:
Quick and convenient switching between Raman and SEM measurement
Automated sample transfer from one measuring position to the other
Integrated software interface for user-friendly measurement control
Correlation of the measurement results and image overlay
No compromise in SEM and Raman imaging capabilities
The RISE Microscope combines all features of a stand-alone SEM and the confocal Raman imaging microscope alpha300 within one instrument:
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Features of RISE Microscope
Scanning Electron Microscope:
- Fully PC-controlled SEM
- Various electron sources: tungsten heated filament, LaB6, Schottky field emission cathode
- Combined electron beam & focus ion beam systems available
- High-vacuum and low-vacuum operation options
- Unique Wide Field Optics design for a variety of working and displaying modes
- Real-time In-Flight Beam Tracing ensures precise, direct and continuous control of the beam current and the spot size
- Advanced 3D Beam Technology for true live stereoscopic imaging and amazing 3D experience and 3D navigation
- Confocal Raman Imaging with unprecedented performance in speed, sensitivity, and resolution
- Hyperspectral image generation with the information of a complete Raman spectrum at every image pixel
- Excellent diffraction limited lateral resolution of 200 - 300 nm
- Outstanding depth resolution ideally suited for 3D image generation and depth profiles
- Ultrahigh-throughput lens-based spectroscopic system for highest sensitivity and best performance in spectral resolution
- Ultra-fast Raman imaging option with only 0.76 ms integration time per spectrum
- Non-destructive imaging technique: no staining of fixation of the sample required
General Specifications
| Microscope Type | Electron |