Rigaku - NEX QC

Manufactured by  Rigaku
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Low-cost energy dispersive X-ray fluorescence analyzer. Elemental analysis of solids, liquids, powders, alloys and thin films by EDXRF

As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control applications. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.

EDXRF optimized for quality control applications

Specifically designed for routine quality control elemental analysis applications, the new Rigaku NEX QC features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.

EDXRF with broad elemental coverage

The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

NEX QC options: autosampler, helium and FP

Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity. For those applications requiring higher resolution and sensitivity, Rigaku offers the new NEX QC+ energy dispersive X-ray fluorescence analyzer which is equipped with a silicon drift detector (SDD).

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Features of NEX QC
  • Analyze Na to U non-destructively
  • Solids, liquids, alloys, powders and thin films
  • 50kV X-ray tube for wide elemental coverage
  • Semiconductor detector for superior data quality
  • Modern smartphone-style "icon-driven" user interface
  • Multiple automated tube filters for enhanced sensitivity
  • Convenient built-in thermal printer
  • Low cost with unmatched performance-to-price ratio
  • Optional fundamental parameters
General Specifications
Depth 17 in
Height14.8 in
Width 13 in
Power Requirements Single phase AC 100/220V, 1.4A (50/60 Hz)
Weight35 lbs
Additional Specifications

Excitation:   
50kV X-ray tube   
4W max power   
6 tube filter positions with shutter   
   
Detection:   
High performance semiconductor detector   
Peltier thermo-electric cooling   
Optimum balance of spectral resolution and max count rate   
   
Sample Chamber:   
Large 190 x 165 x 60 mm sample chamber   
Single position 32 mm sample aperture   
Single position 40 mm sample aperture   
Bulk sample aperture   
6-position 32 mm automatic sample changer   
5-position 40 mm automatic sample chamber   
Single position 32 mm sample spinner   
Analysis in air or helium   
   
Environmental Conditions:   
Ambient temperature 10-35ºC (50-95ºF)   
Relative humidity ?85% non-condensing   
Vibration: undetectable by people   
Free from corrosive gas, dust and particles   
   
Software & Application Packages:   
Qualitative and quantitative analysis   
Normalization and validation feature   
Fundamental parameters   
Data export function with LIMS compatibility   
User selectable shaping times   
Simple flow bar wizard to create new applications   
Icon driven graphical user interface   
   
User Interface:   
Embedded computer   
Internal thermal printer   
USB & Ethernet connections   
   
Options:   
6-position 32 mm automatic sample changer   
5-position 40 mm automatic sample chamber   
Single position 32 mm sample spinner   
Helium purge   
Fundamental parameters

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