Rigaku - NEX QC+
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EDXRF: Energy dispersive X-ray fluorescence analyzer. Elemental analysis of solids, liquids, powders, alloys and thin films by EDXRF
For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.
EDXRF for quality control applications
Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.
EDXRF with high precision and broad elemental coverage
The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).
EDXRF with autosampler, helium and FP options
Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.
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Features of NEX QC+
- Analyze Na to U non-destructively
- Solids, liquids, alloys, powders and thin films
- 50kV X-ray tube for wide elemental coverage
- SDD detector for superior resolution and sensitivity
- Modern smartphone style "icon driven" user interface
- Multiple automated tube filters for enhanced sensitivity
- Convenient built in thermal printer
- Low cost with unmatched performance-to-price ratio
- Optional fundamental parameters
General Specifications
| Depth | 17 in |
| Height | 14.8 in |
| Width | 13 in |
| Power Requirements | Single phase AC 100/220V, 1.4A (50/60 Hz) |
| Weight | 35 lbs |
Additional Specifications
Excitation:
50kV X-ray tube
4W max power
6 tube filter positions with shutter
Detection:
High performance semiconductor detector
Peltier thermo-electric cooling
Optimum balance of spectral resolution and max count rate
Sample Chamber:
Large 190 x 165 x 60 mm sample chamber
Single position 32 mm sample aperture
Single position 40 mm sample aperture
Bulk sample aperture
6-position 32 mm automatic sample changer
5-position 40 mm automatic sample chamber
Single position 32 mm sample spinner
Analysis in air or helium
Environmental Conditions:
Ambient temperature 10-35ºC (50-95ºF)
Relative humidity ?85% non-condensing
Vibration: undetectable by people
Free from corrosive gas, dust and particles
Software & Application Packages:
Qualitative and quantitative analysis
Normalization and validation feature
Fundamental parameters
Data export function with LIMS compatibility
User selectable shaping times
Simple flow bar wizard to create new applications
Icon driven graphical user interface
User Interface:
Embedded computer
Internal thermal printer
USB & Ethernet connections
Options:
6-position 32 mm automatic sample changer
5-position 40 mm automatic sample chamber
Single position 32 mm sample spinner
Helium purge
Fundamental parameters