Rigaku - ZSX Primus III+
Tube-above wavelength dispersive X-ray fluorescence spectrometer. High performance WDXRF for rapid quantitative elemental analysis
Rigaku ZSX Primus III+ delivers rapid quantitative determination of major and minor atomic elements, from oxygen (O) through uranium (U), in a wide variety of sample types — with minimal standards.
Tube above optics for superior reliability
ZSX Primus III+ features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.
High precision sample positioning
The high precision positioning of the sample ensures that the distance between the sample surface and X-ray tube is kept constant. This is important for applications that require high precision, such as the analysis of alloys. ZSX Primus III+ performs high-precision analysis using a unique optical configuration designed to minimize errors caused by non-flat surfaces in samples such as fused beads and pressed pellets
SQX fundamental parameters with EZ-scan software
EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.
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Features of ZSX Primus III+
- Analysis of elements from O to U
- Tube above optics minimizes contamination issues
- Small footprint uses less valuable lab space
- High precision sample positioning
- Special optics reduce errors caused by curved sample surfaces
- Software tools for statistical process control (SPC)
- Evacuation and vacuum leak rates can be optimized for throughput
General Specifications
There are no General Specifications available.
Additional Specifications
General
Elemental coverage:
aO through 92U
Optics:
Wavelength dispersive, sequential, tube above
X-ray generator
X-ray tube:
End window, Rh-anode, 3kW, 60kV
HV power supply:
High frequency inverter, ultra-high stability
Cooling:
Internal water-to-water heat exchanger
Spectrometer
Sample changer:
48 positions standard
Maximum sample size:
51 mm (diameter) by 30 mm (high)
Sample rotation speed:
30 rpm
Primary X-ray filters:
Al25, Al125, Ni40 and Ni400
Beam collimators:
4 auto-selectable diameters: 35, 30, 20 and 10 mm
Divergence slit:
3 auto-selectable: standard, high, and coarse (optional) resolutions
Receiving slit:
For SC and for F-PC detectors
Goniometer:
Θ 2Θ independent drive mechanism
Angular range:
SC: 5-118°, F-PC: 13-148°
Angular reproducibility:
Ultra-high precision
Continuous scan:
0.1 - 240°/min
Crystal changer:
10 crystals, automatic mechanism
Vacuum system:
High-speed system
Detector systems
Heavy element detector:
Scintillation counter (SC)
Light element detector:
Flow proportional counter (F-PC)
Attenuator:
In-out automatic exchanger (1/10)