Maximize your productivity and easily measure impressions on various surface conditions for a wide number of applications with LECO’s new AMH55.
Active Questions & AnswersAsk a Question
There are no current Discussions
Documents & Manuals
There are no Documents or Manuals available.
Features of AMH55
Advanced image-recognition technology allows analysis of information not available with limited threshold-based methods * Measures impressions with various surface conditions, including scratched/etched/unevenly illuminated surfaces
* The ability to choose the model configuration that best fits your needs:
AMH55 Automatic * Simultaneous automatic alignment and automatic parfocal tools, as well as automatic pixel calibration and shading correction * Optional Advanced Analysis Module for color contoured mapping
AMH55 Semi-Automatic * Automatically locates and analyzes indents, automatic alignment, and pixel calibration * Customizable data reporting * Manual focus
AMH55 Lite * Automatically locates and analyzes indents within a field of view * Automatic pixel calibration * Easily upgrade to AMH55 Automatic or Semi-Automatic
There are no General Specifications available.