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SAXSpoint 2.0 is the new laboratory SAXS/WAXS/GISAXS system for analysis of nanostructured materials
SAXSpoint 2.0 is the new laboratory SAXS/WAXS/GISAXS system for analysis of nanostructured materials.
It determines the size, size distribution and shape of nano-sized domains. SAXSpoint 2.0 is especially suited for analysis of anisotropic materials and nanostructured surfaces. SAXSpoint 2.0 employs brilliant X-rays with high spectral purity and scatterless beam collimation.
Combined with the latest hybrid photon-counting (HPC) detectors it ensures short measurement time and high-quality SAXS/WAXS/GISAXS results for the perfect analysis of your nanostructured materials.
Benefit from SAXSpoint’s large variety of innovative and versatile sample stages which cover many SAXS/WAXS/GISAXS applications. SAXSpoint 2.0 is your innovative and reliable partner for your daily nano research of polymers, liquid crystals, nanoparticles and nanostructured surfaces.
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Features of SAXSpoint 2.0
A versatile SAXS/WAXS/GISAXS genius
- Excellent resolution and SAXS/WAXS/GISAXS data quality in a short measurement time
- Brilliant X-ray beam with high spectral purity
- Scatterless beam collimation and the latest hybrid photon-counting (HPC) detector technology
- Versatile sample stages for covering many SAXS/WAXS/GISAXS applications
- Innovative design and spacious sample chamber to meet all your experimental needs
Brilliant features for all needs
- TrueSWAXS – simultaneous small- and wide-angle scattering measurements at scattering angles up to 60° 2?
- Optional WAXS detector module for simultaneous SWAXS measurements with stationary sample holder
- Auto-detection of configuration and sample stages
Full experimental flexibility
- Dedicated point-collimation system with a highly-brilliant X-ray beam specifically suited for analysis of anisotropic samples and nanostructured surfaces
- Optional fully integrated dual microsource with easy switch over between Cu and Mo radiation for covering various SAXS applications
- Optional high-performance set up with fully integrated Ga MetalJet source by Excillum
- Versatile sample environment for any applications, including GISAXS studies, SWAXS measurements under controlled temperature, humidity, tensile stress, pressure, etc.
- High-throughput screening of liquid and solid nanostructured samples
Powerful control and data analysis software
- SAXSdrive™ – full system control for automated SWAXS experiments
- SAXSanalysis™ – simple and fast data processing using customizable templates
- Dedicated software for advanced SAXS data interpretation
General Specifications
| Depth | 2.7 m |
| Width | 0.9 m |
Additional Specifications
X-ray source:
- Microfocus X-ray source (Cu, Mo)
- Optional dual source
- Optional Ga MetalJet source
X-ray optics and collimation:
- Custom-designed optics (fully evacuated)
- Advanced scatterless beam collimation (fully evacuated)
Sample stages/Autosamplers:
- TCStage temperature-controlled stages
- GISAXS stage with heating option
- Tensile Stage with heating/cooling option
- Humidity Stage
- Autosamplers for multiple solid and liquid samples
- Customized stages on request
Special features:
- TrueFocus: self-alignment with X-ray beam
- TrueSWAXS: simultaneous
- SWAXS studies up to 60° 2?
- StageMaster: XYZ stage with auto-recognition of sample stages
Temperature range Atmosphere:
- -150 °C to +500 °C, ± 0.1 °C
- Vacuum, air, inert gas, humidity (reactive gases on request)
Sample holders:
- Quartz capillary for liquids
- LPS (Low Parasitic Scattering) Cell
- Sample holder for solids
- PasteCell for viscous and powder samples
- RotorCell for sample spinning
- High-pressure cells
- Μ-Cell for small sample volumes
- FlowCell/TubeCell for automation
Measurement time: d > 0.13 nm
Software:
- SAXSdrive measurement and acquisition software
- SAXSanalysis data processing and analysis software
- Advanced data interpretation software (PCG)