ASD Inc - TerraSpec 4 Standard-Res Mineral Analyzer
Increase efficiency and optimize metal yield with high-throughput mineralogical analysis, and enjoy even greater data quality with the TerraSpec 4.
Increase efficiency and optimize metal yield with high-throughput mineralogical analysis, and enjoy even greater data quality with the TerraSpec 4 Standard-Res mining analyzer. Top mine operations around the world already trust ASD’s TerraSpec® line of mining instruments for their critical mineral analysis measurements.
Designed to enhance the productivity of mine site ore analysis, the tough and portable TerraSpec 4 Standard-Res mineral analyzer, with 10 nm resolution, provides high-throughput mineralogical analysis to help you optimize ore processing, sorting and ore recovery.
This flexible, near-infrared spectrometer accurately measures a wide variety of geologic samples offering better visibility into the ore sorting, processing and extraction processes. The rugged TerraSpec mineral and ore analyzer transitions easily from the production lab to the field, where it can quickly and accurately analyze ore feeds and tailings.
Designed to boost yield and reduce mineral processing costs in mining production environments, the TerraSpec 4 Standard-Res mining analyzer supplies critical mineralogical information more quickly than other technologies. For example, the TerraSpec spectrometer’s impressive spectral response produces high-quality spectra used to identify clay minerals such as kaolinite, dickite, smectite or montmorillinite in real time with no sample prep required.
The TerraSpec 4 Standard-Res mining analyzer is ideal for a range of mining production measurement applications, including heap leach optimization, ore sorting, agglomeration optimization, and floatation ore feed control.
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Features of TerraSpec 4 Standard-Res Mineral Analyzer
- Improved optics deliver more precise spectral data in a fraction of the time.
- High-throughput sample analysis (capable of analyzing more than 1,000 samples a day) means accurate measurements even in high-volume production environments.
- Upgraded feature recognition helps you analyze darker material and improve management of ore variability.
- Industry-leading performance in the SWIR 1/SWIR 2 regions for unparalleled alteration mineral analysis.
General Specifications
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Additional Specifications
Wavelength Range 350-2500 nm
Resolution 3 nm @ 700 nm and 10 nm @ 1400/2100 nm
Scanning time 100 milliseconds
Signal-to-noise ratio VNIR: 9,000:1 @ 700 nm
SWIR 1: 9,000:1 @ 1400 nm
SWIR 2: 4,000:1 @ 2100 nm
Photometric noise VNIR: 48 ΜAU @ 700 nm
SWIR 1: 48 ΜAU @ 1400 nm
SWIR 2: 110 ΜAU @ 2100 nm
Stray light VNIR: 5000:1 (0.02%)
NIR: 10,000:1 (0.01%)
Wavelength reproducibility 0.1 nm
Wavelength accuracy 0.5 nm
Channels 2151
VNIR detector (350-1000 nm) 512 element silicon array
SWIR 1 & 2 detectors (1001-1800 nm) & (1801-2500 nm) Graded Index InGaAs Photodiode, TE Cooled
Certifications and Approvals CE certified: EN61010-1:2001 2nd Edition
EU Directive: 2006/95/EC, 2004/108/EC
NIST traceable calibration
WEEE Compliance
Communications Wired: 10/100 Base T Ethernet port with Ethernet cross-over cable
Wireless: 802.11g/n wireless card
Dimensions (H x W x D) 12.7 x 36.8 x 29.2 cm (5 x 14.5 x 11.5 in)