ASD Inc - TerraSpec 4 Hi-Res Mineral Spectrometer

Manufactured by  ASD Inc
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Recognized as the de facto technology for mineralogical analysis, the rugged portable TerraSpec mineral spectrometers...

Recognized as the de facto technology for mineralogical analysis, the rugged portable TerraSpec mineral spectrometers are trusted by top geologists for performing fast, precise geologic exploration. The TerraSpec 4 Hi-Res mineral analyzer brings new levels of efficacy to mineral exploration technology. This state-of-the-art mineral spectrometer offers enhanced performance in the SWIR 1 and 2 regions and a 6 nm resolution to help you determine the viability of mineral exploration targets faster and more precisely than ever before. These enhancements provide you with the ability to capture accurate spectral data more quickly, especially for samples with darker mineral features. 
For mining exploration geologists, these improvements translate into faster data capture at exploration targets and drilling sites. The improved data quality provided by the TerraSpec 4 Hi-Res mineral spectrometer also allows for accurate assessment of low-concentration and low-reflectance minerals, like iron-containing minerals such as serpentines and chlorites, which were previously difficult to measure.
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Features of TerraSpec 4 Hi-Res Mineral Spectrometer
  • Enhanced optical configuration provides more precise spectral results for superior spectrum clarity and definition. * Industry leading performance in the SWIR 1/SWIR 2 regions for unparalleled alteration mineral identification. * Standard ruggedized steel covered fiber optic cable ensures consistent spectral quality. * No need for sample prep, which means fast field scans.
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Additional Specifications

Wavelength range 350-2500 nm 
Resolution 3 nm @ 700 nm and 6 nm @ 1400/2100 nm 
Scanning time 100 milliseconds 
Signal-to-noise ratio VNIR: 9,000:1 @ 700 nm 
SWIR 1: 9,000:1 @ 1400 nm 
SWIR 2: 4,000:1 @ 2100 nm 
Stray light VNIR: 5000:1 (0.02%) 
NIR: 10,000:1 (0.01%) 
Wavelength reproducibility 0.1 nm 
Wavelength accuracy 0.5 nm 
Channels 2151 
VNIR detector (350-1000 nm) 512 element silicon array 
SWIR 1 & 2 detectors (1001-1800 nm) & (1801-2500 nm) Graded Index InGaAs Photodiode, TE Cooled 
Certification and Approvals CE certified: EN61010-1:2001 2nd Edition 
EU Directive: 2006/95/EC, 2004/108/EC 
NIST traceable calibration 
WEEE Compliance 
Communications Wired: 10/100 Base T Ethernet port with Ethernet cross-over cable 
Wireless: 802.11g/n wireless card 
Dimensions (H x W x D) 12.7 x 36.8 x 29.2 cm (5 x 14.5 x 11.5 in)

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