The integrating sphere system allows a range of measurements to be made.

• Diffuse Reflectance Measurements
• Diffuse Reflectance
• Turbid or Scattering Samples
• Specular Reflectance
• Diffuse Reflectance of Samples
• Coated Lens Reflectance
• Opthalmic Lens Transmission

The compact sphere, which mounts within the instrument's sample compartment, is made from SpectralonTM which has the highest reflectance over the UV and visible region of any known substance. This gives high energy throughput resulting in excellent performance. The design is versatile, easy to use and allows for the elimination of substitution errors.

A 0° sample rest enables measurements to be carried out with the specular component eliminated. Substituted by a 11° sample rest, total hemispherical reflectance is measured.

Diffuse Reflectance

A dedicated high performance SpectralonTM integrating sphere is used for diffuse reflectance and diffuse transmittance measurements. The sphere unit has its own silicon diode detector which uses a separate signal channel within the Spectrophotometer.

Turbid or Scattering Samples

The sphere unit is equipped with a 10mm pathlength cuvette holder so that transmittance measurements may be made for both turbid or normal samples. Scattering films may also be accommodated for measurement.

Specular Reflectance

A dedicated specular reflectance unit is used for specular reflectance measurements of surfaces and coated opthalmic lenses. The unit is ideal for quality assurance in the production of anti-reflection coated opthalmic lenses, many of these systems are now in use around the world.