Agilent Technologies - Thermal Separation Probe

Manufactured by  Agilent Technologies
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The Agilent Thermal Separation Probe (TSP) provides fast analysis of solid, liquid, and slurry samples. The process i...

The Agilent Thermal Separation Probe (TSP) provides fast analysis of solid, liquid, and slurry samples. The process is simple, clean, and requires limited or zero sample preparation. Non-vaporized high boiling point dirty sample matrix compounds, which can contaminate the GC liner and column, remain inside the micro-vial, and can be discarded after each injection. Use the TSP when testing complex samples in food, forensics, and environmental applications.

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Features of Thermal Separation Probe
  • Little or no sample prep required
  • Greater flexibility with less risk than traditional direct sample probes
  • Multi-mode capability allows you to choose between split, splitless, or MMI modes
  • Low risk of contamination or decrease in performance typically associated with traditional direct sample probes
  • Two ways to use TSP with GC/MS systems: separate complex samples by using a longer analytical column; transfer the neat sample to the MS via a short deactivated capillary column
  • Control sample delivery by adjusting split-flow ratios; eliminates the possibility of overload or contamination of the detector
  • Temperature programming in the inlet and GC column improves identification of multi-component samples; something traditional direct sample probes are unable to accomplish.
  • Integrates with Agilent GC/MS systems and is compatible with the Agilent 5975T GC/MS system, 7890A GC with 5975C Series GC/MSD, 7000 Series Triple Quadrupole GC/MS, 220 Ion Trap GC/MS, and 240 Ion Trap GC/MS
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