Anton Paar - Versatile Laboratory SAXS/WAXS/GISAXS system: SAXSpoint 2.0

Manufactured by  Anton Paar
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SAXSpoint 2.0 is the new laboratory SAXS/WAXS/GISAXS system for analysis of nanostructured materials. It determines t...

SAXSpoint 2.0 is the new laboratory SAXS/WAXS/GISAXS system for analysis of nanostructured materials. It determines the size, size distribution and shape of nano-sized domains. SAXSpoint 2.0 is especially suited for analysis of anisotropic materials and nanostructured surfaces. SAXSpoint 2.0 employs brilliant X-rays with high spectral purity and scatterless beam collimation.

Combined with the latest hybrid photon-counting (HPC) detectors it ensures short measurement time and high-quality SAXS/WAXS/GISAXS results for the perfect analysis of your nanostructured materials.

Benefit from SAXSpoint’s large variety of innovative and versatile sample stages which cover many SAXS/WAXS/GISAXS applications. SAXSpoint 2.0 is your innovative and reliable partner for your daily nano research of polymers, liquid crystals, nanoparticles and nanostructured surfaces.

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Features of Versatile Laboratory SAXS/WAXS/GISAXS system: SAXSpoint 2.0

A versatile SAXS/WAXS/GISAXS genius

  • Excellent resolution and SAXS/WAXS/GISAXS data quality in a short measurement time
  • Brilliant X-ray beam with high spectral purity
  • Scatterless beam collimation and the latest hybrid photon-counting (HPC) detector technology
  • Versatile sample stages for covering many SAXS/WAXS/GISAXS applications
  • Innovative design and spacious sample chamber to meet all your experimental needs

Brilliant features for all needs

  • TrueSWAXS – simultaneous small- and wide- angle scattering measurements at scattering angles up to 60° 2?
  • Optional WAXS detector module for simultaneous SWAXS measurements with stationary sample holder
  • Auto-detection of configuration and sample stages

Full experimental flexibility

  • Dedicated point-collimation system with a highly-brilliant X-ray beam specifically suited for analysis of anisotropic samples and nanostructured surfaces
  • Optional fully integrated dual microsource with easy switch over between Cu and Mo radiation for covering various SAXS applications
  • Optional high-performance set up with fully integrated Ga MetalJet source by Excillum
  • Versatile sample environment for any applications, including GISAXS studies, SWAXS measurements under controlled temperature, humidity, tensile stress, pressure, etc.
  • High-throughput screening of liquid and solid nanostructured samples

Powerful control and data analysis software

  • SAXSdrive™ – full system control for automated SWAXS experiments
  • SAXSanalysis™ – simple and fast data processing using customizable templates
  • Dedicated software for advanced SAXS data interpretation
General Specifications

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