Hitachi - Ultra-high Resolution Scanning Electron Microscope SU9000

Manufactured by  Hitachi
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The SU9000 is HITACHI's new premium SEM. It features unique electron optics, with the sample positioned inside a gap...

The SU9000 is HITACHI's new premium SEM. It features unique electron optics, with the sample positioned inside a gap between the upper and lower parts of the objective lens pole piece. This so-called true in-lens concept - combined with the next generation of HITACHI's cold field emission technology - guarantees the highest possible system resolution (SE resolution 0.4 nm @ 30 kV, 1.2 nm @ 1 kV without requiring beam deceleration technology [0.8nm with beam deceleration]) and stability.
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Features of Ultra-high Resolution Scanning Electron Microscope SU9000
  • The world's highest SE resolution of 0.4 nm at 30 kV is guaranteed. * Usable magnification of up to 3,000,000x. * Newly designed CFE GUN provides high brightness and an extremely stable emission current. * Superior low kV performance for observing beam sensitive materials. * Next generation Hitachi In-Lens SEM optics allows for routine observation at 1,000,000x. * Improved vacuum technology that allows for UHV levels for reduced sample contamination. * Highly engineered instrument enclosure featuring both superior strength and stability to allow for high resolution imaging in a broad range of environmental conditions. * Newly designed objective lens enables high resolution imaging at a low acceleration voltage. * Side entry sample exchange system increases throughput by reducing the time required to change samples and automatically positioning the sample at the current WD.
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