Buck Scientific - Cecil 3055 Reflectance Spectrophototmeter

Manufactured by  Buck Scientific
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Universal Reflectance Measurements    The ReflectaScan Reflectance Spectrophotometer is designed as ...

Universal Reflectance Measurements   
The ReflectaScan Reflectance Spectrophotometer is designed as a universal reflectance measuring instrument capable of scanning samples over the wavelength range 190-1000nm. An integral printer plots results and an external dot matrix or colour inkjet printer may be used if required.   
Diffuse Reflectance Measurements   
The integrating sphere system allows a range of measurements to be made.   
  • Diffuse and specular samples   
  • Total hemispherical reflectance   
  • Specular excluded diffuse reflectance   
  • Transmittance of turbid or scattering samples   
  • Diffuse reflectance of powder samples    
    The compact sphere, which mounts within the instrument's sample compartment, is made from SpectralonTM which has the highest reflectance over the UV and visible region of any known substance. This gives high energy throughput resulting in excellent performance. The design is versatile, easy to use and allows for the elimination of substitution errors.   
    A 0° sample rest enables measurements to be carried out with the specular component eliminated. Substituted by a 11° sample rest, total hemispherical reflectance is measured.
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    Features of Cecil 3055 Reflectance Spectrophototmeter

    Diffuse Reflectance    A dedicated high performance SpectralonTM integrating sphere is used for diffuse reflectance and diffuse transmittance measurements. The sphere unit has its own silicon diode detector which uses a separate signal channel within the Spectrophotometer.   

    Turbid or Scattering Samples    The sphere unit is equipped with a 10mm pathlength cuvette holder so that transmittance measurements may be made for both turbid or normal samples. Scattering films may also be accommodated for measurement.   

    Specular Reflectance    A dedicated specular reflectance unit is used for specular reflectance measurements of surfaces and coated opthalmic lenses. The unit is ideal for quality assurance in the production of anti-reflection coated opthalmic lenses, many of these systems are now in use around the world.   

    Diffuse Reflectance of Samples    A scan is shown here of a poppy coloured paint sample from the Dulux paint range and also an overlay of scans for two blue paint samples each specified by its British    

    Coated Lens Reflectance    The optical performance of the anti-reflection coatings on opthalmic lenses is specifically catered for by the specular reflectance unit. A conical rest is provided to accommodate lenses up to 80mm diameter. Measurements are made with reference to an uncoated lens and the system is excellent for the production control of vacuum coated lenses. Many of these systems are now in everyday use.   

    Opthalmic Lens Transmission    The transmission characteristics of tinted opthalmic lenses may readily be measured using the CE 3077 lens mounting system. This allows the lens to be accurately centred on a carrier plate which is kinematically mounted on the body of the lens holder.   

    Measurement of Thin Films    Using the CE 3075 specular reflectance unit, the thickness of films deposited on a surface, for instance a epitaxial film of silicon dioxide on a silicon wafer, is readily measured.   

    The reflectance scan of such a film against wavelength produces a series of transmission maxima and minima due to the interference between energy reflected from the front surface of the film and that reflected from the interface between the film and its substrate.   

    Film thickness is calculated from an equation relating the number of peaks to their wavelength separation. Films down to about 0.1 microns in thickness may be measured.   

    Colour Computations    Software is available (colour) to enable a wide range of calculations including tristimulus values, chromaticity, CIE L* A* B, CIE L* U* V, Hunter, metric colour, whiteness and yellowness.   

    Standard illuminant tables include CIE, A, B & C and CIE D50, D65 & D75. Observer tables include 2° and 10° angles.   

    CE 3055 ReflectaScan Spectrophotometer    4nm bandpass, 190-1000nm wavelength range, built in integrating sphere signal channel, cell holder, power cable, operators manual and short form operating instructions.

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