Bruker Optics - Portable Μ-XRF Spectrometer

Manufactured by  Bruker Optics
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Designed for On-Site Analyses of Valuable or Stationary Objects

ARTAX is the first commercially available portable µ-XRF spectrometer designed to meet the requirements for a spectroscopic analysis of unique and valuable objects on site, i.e. in archaeometry and art history.   
   
The system performs a simultaneous multi-element analysis in the element range from Na(11) to U(92) and attains a spatial resolution of down to 70 µm.   
   
The measurement is non-destructive and non-contact, there is no damage whatsoever to the objects under investigation. ARTAX is set up and operational within 30 minutes. A normal mains power supply is the only requirement for operating ARTAX.   
   
Depending on the application and available budget, there is a choice of several differently configured spectrometer versions, offering various features and levels of user comfort.
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Features of Portable Μ-XRF Spectrometer
The core piece of the system is a compact measuring head containing: 
  • A specially designed, very compact micro-focus X-ray tube in metal-ceramics technology 
  • A polycapillary X-ray optics that produces a micro-spot of primary X-radiation with outstandingly high intensity. More info 
  • A compact, high resolution, nitrogen-free XFlash® SD detector with high speed/low noise electronics. More info 
  • An advanced sample viewing and analysis spot positioning system. More info    Portability on a tripod  A mobile, vibration damped tripod carries the measuring head, a motor-driven X-Y-Z positioning stage and the control unit. It enables free positioning of the complete measuring system relative to the object under investigation with a reproducibility of better than ±10 µm.    Fast X-ray tube exchange  The measuring head consists of a central unit containing the detector, the CCD camera and the laser spot. The excitation unit, consisting of tube housing, X-ray tube and X-ray optics, is mounted on the side, fixed by a precision lock, which allows a fast exchange. This enables the user to choose the most suitable excitation sources or target materials and also allows fast exchange of the X-ray optics. More info    Light element analysis  The ARTAX is equipped with a helium purging system for light element analysis. Using helium purging the measurement range can be extended from that in ambient air – from Ti(22) to U(92) down to Na(11). Using helium instead of vacuum has the added benefit of not endangering the sample, which might not be vacuum-safe. This light element capability allows detection of P(15), S(16) and Cl(17) as well as Al(13) and Si(14), important elements, which would otherwise go unnoticed.    Additional features 
  • Improved accessibility of samples due to a more compact measuring head design and an increased distance to the sample. 
  • Touch sensor for avoidance of damage to the art object 
  • Improved radiation safety by an additional control terminal for direct access to basic functions 
  • Three safety contacts for additional warning lamps, door interlocks etc. 
  • Software control of the helium flow for light element detection and the laser spot for positioning
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