Highest performance meets utmost flexibility 
Today’s research topics in nanoscience are complex. Therefore a highly flexible AFM system is the first choice. With the new NanoWizard® 4 AFM you are well prepared for any future research project. The system comes with a wide range of modes and accessories for environmental control, mapping of nanomechanical, electrical, magnetic or thermal properties and seamless integration with advanced optical techniques. As a result of JPK‘s leading tip-scanner technology and our consistent modular design philosophy, the NanoWizard® 4 is the most flexible system available on the market today. 
 
Fast scanning capabilities for increased productivity - observe sample dynamics in real-time 
The NanoWizard® 4 NanoScience AFM combines closed-loop atomic resolution with fast scanning capabilities of up to 3 sec/image in a system and comes with a large scan range of 100µm in XY. It has the lowest noise levels of a closed-loop scanner and deflection detection system. The powerful digital Vortis™ controller combines fast signal handling with lowest noise. 
 

Enhance productivity, probe more sample areas in same time 

Do a quick survey over your sample 

Observe changes following sample dynamics in real time 

Perform time lapse studies on polymers, thin films, advanced materials, capsules and others 
 

Quantitative characterization of mechanical properties 
As an expert in force measurements, JPK provides a complete set of methods to characterize mechanical properties. We have the right solution, in particular for very soft or delicate samples or for samples under an external load. JPK's QI™ mode, with its linear Z-movement and a full set of quantitative data in every pixel, allows the extraction of quantitative data such as elasticity, adhesion, dissipation, chemical forces or conductivity. The automated large Z-adjustment has been developed for swelling samples or with a rough topography. The enhanced data analysis capabilities - in particular for modulus calculation with a variety of selectable models - is of great benefit. 
 
Enhanced mapping of material properties 
The characterization of electrical, electromechanical or magnetic sample properties was always a difficult task, in particular on loosely attached, brittle or soft samples. JPK's enhanced QI™-Advanced mode capabilities now make this easy and straight forward. The new system comes with a new Conductive AFM and Kelvin Probe (KPM) module with an enclosed volume which provides a controlled gas environment for the sample. An to round it all off, the NanoWizard® 4 system comes with enhanced STM, Piezo-Response (PFM), Scanning-Thermal AFM and electrochemistry options.