Easily Identify Crystalline Defects  JVSensus enables its users to identify cracks and other defects in the wafer which can cause catastrophic structural failure, BEFORE the breakage occurs. Once a defect has been observed, non-destructive cross section review images can be performed to locate the defect locations within the wafer depth. 

Measure on Patterned Wafers  Measurements can be performed on blanket, patterned, and metalized wafers without sample preparation. The defects can be identified even when a pattern is present on the wafer. Robot loading can be added for wafers sizes from 2” to full 300mm 

Detect Slip  The major cause of overlay issues is slip. Whether it's a logic patterned wafer, GaN on Si or ingot slides , JVSensus can detect slip in minutes.