Amray - 1860 FE

Manufactured by  Amray
Follow this Equipment

Amray 1860 FE Scanning Electron Microscop

Amray 1860 FE-SEM w/Kevex Superdry EDS & Digital Imaging SEM/EDS: Scanning Electron Microscope with Energy Dispersive Spectrometry Schottky Field Emission Gun gives >3nm Resolution 150mm - 6 Inch - Wafer Navigation Sensitive to Elements down to Carbon Analysis Area down to 0.1mm Sensitivity ~1 at % Sample Accommodates 150 mm - 6 Inch - Wafers and Smaller Samples Applications: Wafer Inspection or a Laboratory SEM Failure Analysis: Cross-Section and Plan-View Examination Compositional Microanalysis and Mapping Devices from Data Storage, MEMS, Semiconductor and Related
Active Questions & AnswersAsk a Question

There are no current Discussions

Electron Microscopes Service ProvidersView All (8)

Request Support
Documents & Manuals

There are no Documents or Manuals available.


There are no Features available.

General Specifications

There are no General Specifications available.

Looking for New or Used Equipment?

Shop on LabX

Shop on