ZEISS - EVO® MA 15

Manufactured by  ZEISS
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Analytical SEM - simply getting better

The EVO® MA 15 is the analytical SEM of choice for users offering the leading imaging and analysis solution in Materials Analysis. With a motorised 5 axis stage with large XY and Z travels, variable pressure capability as standard, and easy to use SmartSEM software, the EVO® MA 15 offers a perfect imaging solution in fields from geology, forensics, and failure analysis.
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Features of EVO® MA 15
  • Variable pressure operation
  • Class leading xray and EBSD analysis.
  • Large stage movements
  • Fast pump down
  • Wavelength dispersive port as standard
  • Future Assured upgrades to high pressure and water vapour enabled imaging and analysis
  • High brightness LaB6 source option
  • BeamSleeve® option

New features

  • Remote Diagnostics over the internet
  • Motorised Z movement of 50 mm, X and Y both 125 mm
  • Largest specimen height increased to 145 mm
  • Improved low kV imaging
  • Improved La6 imaging for x-ray analysis
General Specifications
Accelerating voltage0.2 to 30 kV
Electron Microscope TypeSEM
Power Requirements 100 - 240 V, 50 or 60 Hz single phase, no water cooling requirement
Microscope TypeElectron
Additional Specifications

Magnification:     
< 5 - 1,000,000 x    
Field of View:    
6mm at the Analytical Working Distance (AWD)    
X-ray Analysis:    
8.5mm AWD and 35° take-off angle    
OptiBeam®* Modes:    
Resolution, Depth, Analysis, Field, Fisheye    
Pressure Range:    
10 - 400 Pa (MA Series)    
10 - 3000 Pa (LS Series)    
Available Detectors:    
BSD  Multisegment Diode    
ETSE  Everhart-Thornley Secondary Electron Detector    
VPSE  Variable Pressure Secondary Electron Detector    
SCD  Specimen Current Detector    
Chamber:    
365mm (Ø) x 275mm (h)    
Maximum Specimen Height:    
145 mm    
Image Framestore:    
3072 x2304 pixel, signal acquisition by integrating and averaging

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