Tescan - MIRA 3 LM
A high brightness Schottky emitter for high-resolution/ high-current/low-noise imaging
Active Questions & AnswersAsk a Question
There are no current Discussions
Electron Microscopes Service ProvidersView All (8)
Documents & Manuals
There are no Documents or Manuals available.
Features of MIRA 3 LM
Modern Electron Optics
- A unique three-lens Wide Field Optics design offers a variety of working and displaying modes.
- The proprietary Intermediate Lens (IML) that works as an „Aperture Changer“ makes the exchange of the effective final aperture in an electromagnetic way.
- The column construction, without any mechanical centering elements, allows fully automated column set-up and alignment
- Real time In-Flight Beam Tracing™ for the performance and beam optimization integrating the well established software Electron Optical Design. It includes also direct and continual control of beam spot size and beam current
- Unique live stereoscopic imaging an 3D surface reconstruction utilizing the 3D Beam technology
- Fast imaging rate up to 20 ns/pixel
Analytical Potential
- A large chamber with 5 axes motorized compucentric stage
- Fast imaging rates due to first class YAG-based detectors
- 11+ chamber interface ports with optimized geometry for EDX, WDX, EBSD
- Integrated pneumatic or optional active vibration isolation for ambient vibration reduction
Automated Analysis
- The fast and accurate computer controlled stage is suitable for different applications in automated analysis
- Communication with external software or third party products via TCP/IP interface (e.g. automated EDX analysis)
- High-throughput large-area automation, e.g. automated particle location and analysis
Sophisticated Control
- A fully automated microscope set-up including electron optics set-up and alignment
- Sophisticated software for SEM control, image acquisition, archiving, processing and analysis
- Multi-user environment localized in many languages
- Three levels of user expertise, including an EasySEM mode for inexperienced users
- Built-in image management and report creation
- Network operations and built-in remote access/diagnostics
- System built in self-diagnostics
General Specifications
Electron Microscope Type | SEM |
Microscope Type | Electron |
Additional Specifications
SEM Column
Electron Gun:
High brightness Schottky Emitter
Resolution (In-Beam SE):
1 nm at 30 kV
2 nm at 3 kV
Resolution (SE-ET):
1.2 nm at 30kV
2.5 nm at 3 kV
Resolution Low Vacuum (LVSTD):
1.5 nm at 30 kV
3 nm at 3kV
Magnification:
3.5x to 1,000,000x
Accelerating Voltage:
200 V to 30 kV
Probe Current:
2 pA to 100 nA
Chamber
Internal diameter:
230 mm
Door width:
148 mm
Number of ports:
11+
Chamber suspension:
pneumatic or optionally active vibration isolation
Working Vacuum
High vacuum mode:
< 9 × 10-3 Pa
Low vacuum mode (LMU):
7150 Pa
Stage
Type:
compucentric
Movements:
Fully motorized:
X = 80 mm, Y = 60 mm, Z = 47 mm
Rotation: 360° continuous
Tilt: -80° to + 80° *
* - range depends on WD and detector configuration
Specimen height:
maximum 81 mm