Tescan - MIRA 3 LM

Manufactured by  Tescan
Follow this Equipment

A high brightness Schottky emitter for high-resolution/ high-current/low-noise imaging

Active Questions & AnswersAsk a Question

There are no current Discussions

Electron Microscopes Service ProvidersView All (8)

Request Support
Documents & Manuals

There are no Documents or Manuals available.

Features of MIRA 3 LM

Modern Electron Optics

  • A unique three-lens Wide Field Optics design offers a variety of working and displaying modes.
  • The proprietary Intermediate Lens (IML) that works as an „Aperture Changer“ makes the exchange of the effective final aperture in an electromagnetic way.
  • The column construction, without any mechanical centering elements, allows fully automated column set-up and alignment
  • Real time In-Flight Beam Tracing™ for the performance and beam optimization integrating the well established software Electron Optical Design. It includes also direct and continual control of beam spot size and beam current
  • Unique live stereoscopic imaging an 3D surface reconstruction utilizing the 3D Beam technology
  • Fast imaging rate up to 20 ns/pixel

Analytical Potential

  • A large chamber with 5 axes motorized compucentric stage
  • Fast imaging rates due to first class YAG-based detectors
  • 11+ chamber interface ports with optimized geometry for EDX, WDX, EBSD
  • Integrated pneumatic or optional active vibration isolation for ambient vibration reduction

Automated Analysis

  • The fast and accurate computer controlled stage is suitable for different applications in automated analysis
  • Communication with external software or third party products via TCP/IP interface (e.g. automated EDX analysis)
  • High-throughput large-area automation, e.g. automated particle location and analysis

Sophisticated Control

  • A fully automated microscope set-up including electron optics set-up and alignment
  • Sophisticated software for SEM control, image acquisition, archiving, processing and analysis
  • Multi-user environment localized in many languages
  • Three levels of user expertise, including an EasySEM mode for inexperienced users
  • Built-in image management and report creation
  • Network operations and built-in remote access/diagnostics
  • System built in self-diagnostics
General Specifications
Electron Microscope TypeSEM
Microscope TypeElectron
Additional Specifications

SEM Column  
Electron Gun:   
High brightness Schottky Emitter  
Resolution (In-Beam SE):  
1 nm at 30 kV  
2 nm at 3 kV  
Resolution (SE-ET):  
1.2 nm at 30kV  
2.5 nm at 3 kV  
Resolution Low Vacuum (LVSTD):  
1.5 nm at 30 kV  
3 nm at 3kV  
Magnification:  
3.5x to 1,000,000x  
Accelerating Voltage:   
200 V to 30 kV  
Probe Current:   
2 pA to 100 nA  
  
Chamber  
Internal diameter:   
230 mm  
Door width:   
148 mm  
Number of ports:   
11+  
Chamber suspension:   
pneumatic or optionally active vibration isolation  
  
Working Vacuum  
High vacuum mode:  
< 9 × 10-3 Pa  
Low vacuum mode (LMU):  
7150 Pa  
  
Stage  
Type:   
compucentric  
Movements:   
Fully motorized:  
X = 80 mm, Y = 60 mm, Z = 47 mm  
Rotation: 360° continuous  
Tilt: -80° to + 80° *  
* - range depends on WD and detector configuration  
Specimen height:   
maximum 81 mm

Looking for

Tescan - MIRA 3 LM?

Shop on LabX.com