JEOL - JEM-1011
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JEM-1011 Transmission Electron Microscope
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Features of JEM-1011
- user friendly controls
- file storage
- automatic filament heating
- automatic exposure micrograph photography
General Specifications
| Magnification | 800 to 600000 x |
| Accelerating voltage | 40 to 100 kV |
| Electron Microscope Type | TEM |
| Microscope Type | Electron |
Additional Specifications
Resolution
Lattice Image: 0.2nm
Point Image: 0.4nm
Accelerating Voltage
Variable Steps: 25 V min.
Stability: 250 V with lens excitation correction
Magnification (steps)
Low Mag Mode (14): x50-1,000
SA Mag Mode (22): x2,500-300,000
IOS Mode (13): x2,500-30,000
Camera Length (steps)
SA DIFF (15): 150-3,500mm
HD DIFF (14): 4-80mm
FR DIFF (option): 337mm
Objective Lens
Polepiece: EM-SAP-10B
Focal Length: 3.9mm
Spherical Aberration Coefficient: 3.4mm
Chromatic Aberration Coefficient: 3.0mm
Minimum Focal Step: 9.8nm
Exciting Current Stability: 1 ppm/min.
Specimen Stage: side entry goniometer
Specimen Chamber
Specimen per Load: 2
Specimen Tilt Angle (X-axis): ±20°
Specimen Movements
X Direction: 8.5mm
Y Direction: 2.0mm
Z Direction: 0.5mm (+0.2/-0.3mm)
*High Contrast*