JEOL - JEM-1400
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JEM-1400 Transmission Electron Microscope
The new JENIE™ software included with the JEM-1400 offers a set of tutorials and user guides designed to help beginning microscopists familiarize themselves with the microscope, but also allows experienced users to explore and understand advanced features. The Windows™ GUI is programmed with the latest in Windows™ based technologies and allows remote operation and communication between groups via a TCP/IP connection and a web browser.
The JEM-1400 also supports optional STEM digital imaging/scanning circuitry which displays STEM images (BF/DF) on the standard GUI. An EDS can be added for elemental mapping.
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General Specifications
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Additional Specifications
Resolution
Lattice Image: 0.20nm
Point Image: 0.38nm
Accelerating Voltage
Variable Steps: 33 V min. step
Stability: 2 x 10-6/min.
Magnification
Low Mag Mode: x50-1,000
SA Mag Mode: x2,000-300,000
Camera Length
SA DIFF: 150-3,500mm
HD DIFF: 4-80m
Condenser Lens
C.L. (gaps): 2-stage (single)
Spot Size: 5-step
Min. Probe Dia.: 0.2µm
Specimen Stage: Microactive goniometer with Piezo drives
Specimen Chamber
Specimen per Load: 1
Specimen Tilt Angle (X-axis): ±25° (±70° with optional holder
Specimen Movements
X Direction: ±1.0mm
Y Direction: ±1.0mm
Z Direction: ±0.5mm
Series Modals
JEOL - High Contrast
[+] View Model Specifications| Magnification | 200 to 1200000 x |
| Accelerating voltage | 40 to 120 kV |
| Electron Microscope Type | TEM |
| Microscope Type | Electron |
| Additional Model Specifications | Resolution Lattice Image: 0.20nm Point Image: 0.38nm Accelerating Voltage Variable Steps: 33 V min. step Stability: 2 x 10-6/min. Magnification Low Mag Mode: x50-1,000 SA Mag Mode: x2,000-300,000 Camera Length SA DIFF: 150-3,500mm HD DIFF: 4-80m Condenser Lens C.L. (gaps): 2-stage (single) Spot Size: 5-step Min. Probe Dia.: 0.2µm Specimen Stage: Microactive goniometer with Piezo drives Specimen Chamber Specimen per Load: 1 Specimen Tilt Angle (X-axis): ±25° (±70° with optional holder Specimen Movements X Direction: ±1.0mm Y Direction: ±1.0mm Z Direction: ±0.5mm |
JEOL - STEM
[+] View Model Specifications| Magnification | 1000 to 600000 x |
| Accelerating voltage | 40 to 120 kV |
| Electron Microscope Type | TEM |
| Microscope Type | Electron |
| Additional Model Specifications | Resolution Lattice Image: 0.20nm Point Image: 0.38nm Accelerating Voltage Variable Steps: 33 V min. step Stability: 2 x 10-6/min. Magnification Low Mag Mode: x50-1,000 SA Mag Mode: x2,500-300,000 Camera Length SA DIFF: 15-3,000mm HD DIFF: 4-80m Condenser Lens C.L. (gaps): 3-stage (double) Spot Size: 5-step Min. Probe Dia.: 50nm Specimen Stage: Microactive goniometer with Piezo drives Specimen Chamber Specimen per Load: 1 Specimen Tilt Angle (X-axis): ±30° (±70° with optional holder) Specimen Movements X Direction: ±1.0mm Y Direction: ±1.0mm Z Direction: ±0.5mm |