JEOL - JEM-2100F
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JEM-2100F Transmission Electron Microscope
The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries.
The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. The JEM-2100F can be equipped with STEM, MDS, EDS, EELS, and CCD-cameras.
The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. The JEM-2100F can be equipped with STEM, MDS, EDS, EELS, and CCD-cameras.
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Series Modals
JEOL - Cryo
[+] View Model Specifications| Magnification | 50 to 6000 |
| Accelerating voltage | 80 to 200 kV |
| Electron Microscope Type | TEM |
| Microscope Type | Electron |
| Additional Model Specifications | Resolution Lattice Image: 0.14nm Point Image: 0.25nm Accelerating Voltage Variable Steps: 50 V min. Stability: 2 ppm/min. Objective Lens Polepiece: CRP Exciting Current Stability: 1 ppm/min. Specimen Stage: Micro active goniometer Specimen Chamber Specimen per Load: 1 Specimen Tilt Angle (X-axis): ±60° Specimen Movements X Direction: 2.0mm Y Direction: 2.0mm Z Direction: 0.4mm (±0.2mm) |
JEOL - High Contrast
[+] View Model Specifications| Magnification | 50 to 6000 x |
| Accelerating voltage | 80 to 200 kV |
| Electron Microscope Type | TEM |
| Microscope Type | Electron |
| Additional Model Specifications | Resolution Lattice Image: 0.14nm Point Image: 0.31nm Accelerating Voltage Variable Steps: 50 V min. Stability: 2 ppm/min. Objective Lens Polepiece: HCP Exciting Current Stability: 1 ppm/min. Specimen Stage: Micro active goniometer Specimen Chamber Specimen per Load: 1 Specimen Tilt Angle (X-axis): ±38° Specimen Tilt Angle (Y-axis): ±30° Specimen Movements X Direction: 2.0mm Y Direction: 2.0mm Z Direction: 0.4mm (±0.2mm) |
JEOL - High Resolution
[+] View Model Specifications| Magnification | 2000 to 1500000 x |
| Accelerating voltage | 80 to 200 kV |
| Electron Microscope Type | TEM |
| Microscope Type | Electron |
| Additional Model Specifications | Resolution Lattice Image: 0.1nm Point Image: 0.23nm Accelerating Voltage Variable Steps: 50 V min. Stability: 2 ppm/min. Magnification (steps) Low Mag Mode (20): x50-6,000 SA Mag Mode (21): x8,000-800,000 Camera Length (steps) SA DIFF (15): 80-2,000mm HD DIFF (14): 4-80mm HR DIFF: 333mm Objective Lens Polepiece: HTP Focal Length: 2.3mm Spherical Aberration Coefficient: 1.0mm Chromatic Aberration Coefficient: 1.4mm Minimum Focal Step: 1.5nm Exciting Current Stability: 1 ppm/min. Specimen Stage: Micro active goniometer Specimen Chamber Specimen per Load: 1 Specimen Tilt Angle (X-axis): ±35° Specimen Tilt Angle (Y-axis): ±30° Specimen Movements X Direction: 2.0mm Y Direction: 2.0mm Z Direction: 0.4mm (±0.2mm) |
JEOL - Specimen High Tilt
[+] View Model Specifications| Magnification | 1500 to 1200000 x |
| Accelerating voltage | 80 to 200 kV |
| Electron Microscope Type | TEM |
| Microscope Type | Electron |
| Additional Model Specifications | Resolution Lattice Image: 0.1nm Point Image: 0.25nm Accelerating Voltage Variable Steps: 50 V min. Stability: 2 ppm/min. Magnification (steps) Low Mag Mode (20): x50-6,000 SA Mag Mode (21): x6,000-600,000 Camera Length (steps) SA DIFF (15): 100-2,500mm HD DIFF (14): 4-80mm HR DIFF: 333mm Objective Lens Polepiece: HRP Focal Length: 2.7mm Spherical Aberration Coefficient: 1.4mm Chromatic Aberration Coefficient: 1.8mm Minimum Focal Step: 1.8nm Exciting Current Stability: 1 ppm/min. Specimen Stage: Micro active goniometer Specimen Chamber Specimen per Load: 1 Specimen Tilt Angle (X-axis): ±42° Specimen Tilt Angle (Y-axis): ±30° Specimen Movements X Direction: 2.0mm Y Direction: 2.0mm Z Direction: 0.4mm (±0.2mm) |
JEOL - Ultra High Resolution
[+] View Model Specifications| Magnification | 2000 to 1500000 x |
| Accelerating voltage | 80 to 200 kV |
| Electron Microscope Type | TEM |
| Microscope Type | Electron |
| Additional Model Specifications | Resolution Lattice Image: 0.1nm Point Image: 0.19nm Accelerating Voltage Variable Steps: 50 V min. Stability: 2 ppm/min. Magnification (steps) Low Mag Mode (20): x50-6,000 SA Mag Mode (21): x8,000-800,000 Camera Length (steps) SA DIFF (15): 80-2,000mm HD DIFF (14): 4-80mm HR DIFF: 333mm Objective Lens Polepiece: URP Focal Length: 1.9mm Spherical Aberration Coefficient: 0.5mm Chromatic Aberration Coefficient: 1.1mm Minimum Focal Step: 1.0nm Exciting Current Stability: 1 ppm/min. Specimen Stage: Micro active goniometer Specimen Chamber Specimen per Load: 1 Specimen Tilt Angle (X-axis): ±25° Specimen Tilt Angle (Y-axis): ±25° Specimen Movements X Direction: 2.0mm Y Direction: 2.0mm Z Direction: 0.2mm (±0.1mm) |