Environmental measures   The JEM-ARM200F offers the ultimate stability for imaging and analysis at the atomic scale. The electron column is isolated from the environmental disturbances found in most labs. A superior shielding design safeguards the ultrahigh-powered optics from airflow, vibration, acoustical, and electronic interference, magnetic fields, and thermal fluctuations.  

Enhanced mechanical stability   To enable atomic level analysis and imaging - utilizing spherical aberration correctors for electron optic and image forming systems - vibration and distortion on the atomic level need to be controlled. The ARM 200F features an overall mechanical strength twice higher than conventional TEMs. Enlarging the column size improves rigidity and optimizing the console structure enhances mechanical stability.  

Enhanced electrical stability   The ARM200F reduces the fluctuation of the high voltage system and the objective lens current by 50% of that of conventional TEMs, significantly enhancing its electrical stability.  

Wide ranging STEM analytical capabilities   Two types of dark field detectors with different STEM detection angles (one as standard), a bright field detector (standard), and a backscattered electron detector (option) can be simultaneously installed. A new scanning image acquisition system is capable of acquiring 4 different types of signals, enabling simultaneous observation of all 4 images.  

Optional spherical aberration corrector for TEM image forming system   With an optional spherical aberration corrector, the resolution of the TEM image can be improved to 0.11 nm.   

Integrated Software Automation   The latest in software automation has been designed into the new ARM200F, with tomography and holography simplified by a user-friendly GUI.